Perpendicular magnetic recording medium

ABSTRACT

The present invention provides a perpendicular magnetic recording medium  11  having a perpendicular magnetization film  22  formed on a substrate  20 , wherein a high perpendicular orientation film  24  having higher perpendicular orientation than that of the perpendicular magnetization film  22  is formed over or/and under the perpendicular magnetization film  22.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to a perpendicular magnetic recording medium used as a magnetic disc.

2. Description of the Related Art

Recently, with progress of personal computers and work stations, the hard disc has been required to have a large capacity and small size, i.e., a high density. However, in order to realize a high recording density in the conventional longitudinal direction recording method, there are various problems. For example, if the recording bit is made smaller, there arises a problem of thermal fluctuation of recording magnetization and a problem of high coercive force which may exceed the recording capability of the recording head. To cope with this, a perpendicular magnetic recording method has been studied as means to significantly increase the recording density.

FIG. 156 is a cross sectional view of such a conventional magnetic recording medium. In this perpendicular magnetic recording medium 50, a perpendicular magnetization film 54 having a perpendicular magnetic anisotropy is formed on a substrate 56. For example, CoCr alloys are used for the perpendicular magnetization film (Journal of Magn. Soc. Japan, Vol. 8, No. 1, 1984, pp.17-22).

However, in such a conventional perpendicular magnetic recording medium, there has been a problem that medium noise characteristic is very bad in a low recording density region. This is because the perpendicular magnetization film 54 is magnetized perpendicularly, and a demagnetizing field caused by the magnetic poles generated on the medium surface generates a reversed-magnetic domain. The lower is the recording density, the more the reversed-magnetic domains are generated. This has been the main cause to deteriorate the medium noise characteristic in the low recording density region. This medium noise increase in the low recording density region becomes a big trouble when forming a high-density information recording apparatus.

In order to reduce the effect of the demagnetizing field generated by the magnetic pole generated on the medium surface, there has been suggested to provide a soft magnetic layer under the perpendicular magnetization film so as to reduce the magnetic poles generated at the boundary between the perpendicular magnetization film and the soft magnetic layer (Japanese Patent Publication (examined) B58-91). This is generally known as a perpendicular two-layered magnetic recording medium.

However, in this two-layered perpendicular magnetic recording medium, if a perpendicular magnetization film is provided on a soft magnetic layer such as NiFe (Permalloy), there arises a problem that the soft magnetic layer generates a spike-shaped noise, disabling to obtain a preferable medium S/N ratio.

To cope with this, Japanese Patent Publication (unexamined) A59-127235, Japanese Patent Publication (unexamined) A59-191130, Japanese Patent Publication (unexamined) A60-239916, Japanese Patent Publication (unexamined) A61-8719, and Japanese Patent Publication (unexamined) A1-173312 suggest use of a perpendicular magnetization film on a backing layer made from Co or a Co alloy which is more advantageous than use of the permalloy soft magnetic layer.

However, the inventor of the present invention has found that when these soft magnetic films are used, these films easily absorb an external magnetic field generated by a magnetic disc rotation spindle motor. This results in concentration of the magnetic flux in a magnetic head and losing of recording signals. That is, the perpendicular magnetic recording medium of the two-layered film configuration can reduce the effect of the demagnetizing field caused by the magnetic poles generated on the medium surface, but this cannot be a solution for medium noise reduction.

SUMMARY OF THE INVENTION

It is therefore an object of the present invention to provide a perpendicular magnetic recording medium having a reduced effect of the demagnetizing field caused by a magnetic poles generated on a perpendicular magnetization film surface and having a preferable medium noise characteristic in a low recording density region.

The perpendicular magnetic recording medium according to the present invention has a perpendicular magnetization film formed on a substrate, wherein a high perpendicular orientation film having higher perpendicular orientation than the perpendicular magnetization film is formed over or/and under the perpendicular magnetization film.

A backing soft magnetic film may be formed under the high perpendicular orientation film, or under the perpendicular magnetic film if there is no high perpendicular orientation film under the perpendicular magnetization film.

It is preferable-that the high perpendicular orientation film have a perpendicular magnetic anisotropic energy Ku [erg/cc] and a saturation magnetization Ms [emu/cc] which are in the relationship R defined as 2Ku/4^(π)Ms² equal to or greater than (≧) 1.4.

Moreover, it is preferable that the high perpendicular orientation film have a greater perpendicular magnetic anisotropic energy than that of the perpendicular magnetization film. The perpendicular magnetic anisotropic energy of the high perpendicular orientation film is preferably equal to or greater than 1×10⁶ [erg/cc], and more preferably equal to or greater than 2×10⁷ [erg/cc]. The high perpendicular orientation film preferably has a thickness equal to or greater than 50 [nm]

The high perpendicular orientation film is preferably made from: a CoCrM alloy (wherein M represent three elements selected from a group consisting of Pt, Ta, La, Lu, Pr, and Sr); an alloy containing RCo₅ (R=Y, Ce, Sm, La, Pr) as a main content; an alloy containing R₂Co₁₇ (R=Y, Ce, Sm, La, Pr) as a main content; Ba ferrite (BaFe₁₂O₁₉ BaFe₁₈O₂₇ and the like); Sr ferrite (SrFe₁₂O₁₉, SrFe₁₈O₂₇ and the like), PtCo, and the like.

The backing soft magnetic film is preferably made from FeSiAl, FesiAl alloy, FeTaN, FeTaN alloy, and the like.

In the perpendicular magnetic recording medium according to the present invention, the perpendicular magnetization film on its upper surface or lower surface a high perpendicular orientation film having a higher perpendicular orientation than that of the perpendicular magnetization film. Accordingly, it is possible to significantly suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

When the high perpendicular orientation film is made from a CoCr alloy, it is preferable that the perpendicular magnetic anisotropic energy Ku [erg/cc] and the saturation magnetization Ms [emu/cc] be in the relationship as R=2Ku/4^(π)Ms² wherein R≧1.4.

On the other hand, when the high perpendicular orientation film is made from a SmCo alloy (i.e., a material other than the CoCr alloy), it is preferable that the high perpendicular orientation film have a perpendicular magnetic anisotropic energy Ku greater than that of the perpendicular magnetization film. This enables to reduce generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a cross sectional view of a perpendicular magnetic recording medium according to a first embodiment of the present invention.

FIG. 2 is a cross sectional view of a perpendicular magnetic recording medium according to a second embodiment of the present invention.

FIG. 3 is a cross sectional view of a perpendicular magnetic recording medium according to a third embodiment of the present invention.

FIG. 4 is a cross sectional view of a perpendicular magnetic recording medium according to a fourth embodiment of the present invention.

FIG. 5 is a cross sectional view of a perpendicular magnetic recording medium according to a fifth embodiment of the present invention.

FIG. 6 is a cross sectional view of a perpendicular magnetic recording medium according to a sixth embodiment of the present invention.

FIG. 7 is a table showing values of perpendicular magnetic anisotropic energy Ku and saturation magnetization Ms for each of the Examples of the present invention.

FIG. 8 is a graph showing medium noise dependency on the recording density in Example 1 of the present invention.

FIG. 9 is a table showing relationships between the film thickness and the medium noise in Example 1 of the present invention.

FIG. 10 is another table showing relationships between the film thickness and the medium noise in the Example 1 of the present invention.

FIG. 11 is still another table showing relationship between the film thickness and the medium noise in the Example 1 of the present invention.

FIG. 12 is yet another table showing relationships between the film thickness and the medium noise in the Example 1 of the present invention.

FIG. 13 is still yet another table showing relationships between the film thickness and the medium noise in the Example 1 of the present invention.

FIG. 14 is a table showing values of the perpendicular magnetic anisotropic energy Ku and saturation magnetization Ms for the respective Examples of the present invention.

FIG. 15 is a graph showing the medium noise dependency on the recording density in Example 2 of the present invention.

FIG. 16 is another table showing the relationship between the film thickness and the medium noise in Example 2 of the present invention.

FIG. 17 is still another table showing the relationship between the film thickness and the medium noise in Example 2 of the present invention.

FIG. 18 is yet another table showing the relationship between the film thickness and the medium noise in Example 2 of the present invention.

FIG. 19 is still yet another table showing the relationship between the film thickness and the medium noise in Example 2 of the present invention.

FIG. 20 is yet another table showing the relationship between the film thickness and the medium noise in Example 2 of the present invention.

FIG. 21 is a table showing values of the perpendicular magnetic anisotropic energy Ku and saturation magnetization Ms for the respective Examples of the present invention.

FIG. 22 is a graph showing the medium noise dependency on the recording density in Example 3 of the present invention.

FIG. 23 is a table showing the relationship between the film thickness and the medium noise in Example 3 of the present invention.

FIG. 24 is another table showing the relationship between the film thickness and the medium noise in Example 3 of the present invention.

FIG. 25 is still another table showing the relationship between the film thickness and the medium noise in Example 3 of the present invention.

FIG. 26 is yet another table showing the relationship between the film thickness and the medium noise in Example 3 of the present invention.

FIG. 27 is still yet another table showing the relationship between the film thickness and the medium noise in Example 3 of the present invention.

FIG. 28 is a table showing values of the perpendicular magnetic anisotropic energy Ku and saturation magnetization Ms for the respective Examples of the present invention.

FIG. 29 is a graph showing the medium noise dependency on the recording density in Example 4-1 of the present invention.

FIG. 30 is a table showing the relationship between the film thickness and the medium noise in Example 4-1 of the present invention.

FIG. 31 is another table showing the relationship between the film thickness and the medium noise in Example 4-1 of the present invention.

FIG. 32 is still another table showing the relationship between the film thickness and the medium noise in Example 4-1 of the present invention.

FIG. 33 is yet another table showing the relationship between the film thickness and the medium noise in Example 4-1 of the present invention.

FIG. 34 is still yet another table showing the relationship between the film thickness and the medium noise in Example 4-1 of the present invention.

FIG. 35 is a table showing values of the perpendicular magnetic anisotropic energy Ku and saturation magnetization Ms for the respective Examples of the present invention.

FIG. 36 is a graph showing the medium noise dependency on the recording density in Example 4-2 of the present invention.

FIG. 37 is a table showing the relationship between the film thickness and the medium noise in Example 4-2 of the present invention.

FIG. 38 is another table showing the relationship between the film thickness and the medium noise in Example 4-2 of the present invention.

FIG. 39 is still another table showing the relationship between the film thickness and the medium noise in Example 4-2 of the present invention.

FIG. 40 is yet another table showing the relationship between the film thickness and the medium noise in Example 4-2 of the present invention.

FIG. 41 is still yet another table showing the relationship between the film thickness and the medium noise in Example 4-2 of the present invention.

FIG. 42 is a graph showing the medium noise dependency on the recording density in Example 5 of the present invention.

FIG. 43 is a table showing the relationship between the film thickness and the medium noise in Example 5 of the present invention.

FIG. 44 is a table showing the relationship between the film thickness and the medium noise in Example 5 of the present invention.

FIG. 45 is another table showing the relationship between the film thickness and the medium noise in Example 5 of the present invention.

FIG. 46 is still another table showing the relationship between the film thickness and the medium noise in Example 5 of the present invention.

FIG. 47 is yet another table showing the relationship between the film thickness and the medium noise in Example 5 of the present invention.

FIG. 48 is a graph showing the medium noise dependency on the recording density in Example 6 of the present invention.

FIG. 49 is a table showing the relationship between the film thickness and the medium noise in Example 6 of the present invention.

FIG. 50 is another table showing the relationship between the film thickness and the medium noise in Example 6 of the present invention.

FIG. 51 is still another table showing the relationship between the film thickness and the medium noise in Example 6 of the present invention.

FIG. 52 is yet another table showing the relationship between the film thickness and the medium noise in Example 6 of the present invention.

FIG. 53 is still yet another table showing the relationship between the film thickness and the medium noise in Example 6 of the present invention.

FIG. 54 is a graph showing the medium noise dependency on the recording density in Example 7 of the present invention.

FIG. 55 is a table showing the relationship between the film thickness and the medium noise in Example 7 of the present invention.

FIG. 56 another table showing the relationship between the film thickness and the medium noise in Example 7 of the present invention.

FIG. 57 is still another table showing the relationship between the film thickness and the medium noise in Example 7 of the present invention.

FIG. 58 is yet another table showing the relationship between the film thickness and the medium noise in Example 7 of the present invention.

FIG. 59 is yet still another table showing the relationship between the film thickness and the medium noise in Example 7 of the present invention.

FIG. 60 is a graph showing the medium noise dependency on the recording density in Example 8-1 of the present invention.

FIG. 61 is a table showing the relationship between the film thickness and the medium noise in Example 8-1 of the present invention

FIG. 62 is another table showing the relationship between the film thickness and the medium noise in Example 8-1 of the present invention.

FIG. 63 is yet another table showing the relationship between the film thickness and the medium noise in Example 8-1 of the present invention.

FIG. 64 is still another table showing the relationship between the film thickness and the medium noise in Example 8-1 of the present invention.

FIG. 65 is yet still another table showing the relationship between the film thickness and the medium noise in Example 8-1 of the present invention.

FIG. 66 is a graph showing the medium noise dependency on the recording density in Example 8-2 of the present invention.

FIG. 67 is a table showing the relationship between the film thickness and the medium noise in Example 8-2 of the present invention.

FIG. 68 is another table showing the relationship between the film thickness and the medium noise in Example 8-2 of the present invention.

FIG. 69 is yet another table showing the relationship between the film thickness and the medium noise in Example 8-2 of the present invention.

FIG. 70 is still another table showing the relationship between the film thickness and the medium noise in Example 8-2 of the present invention.

FIG. 71 is yet still another table showing the relationship between the film thickness and the medium noise in Example 8-2 of the present invention.

FIG. 72 is a graph showing the medium noise dependency on the recording density in Example 9 of the present invention.

FIG. 73 is a table showing the relationship between the film thickness and the medium noise in Example 9 of the present invention.

FIG. 74 is another table showing the relationship between the film thickness and the medium noise in Example 9 of the present invention.

FIG. 75 is yet another table showing the relationship between the film thickness and the medium noise in Example 9 of the present invention.

FIG. 76 is still another table showing the relationship between the film thickness and the medium noise in Example 9 of the present invention.

FIG. 77 is yet still another table showing the relationship between the film thickness and the medium noise in Example 9 of the present invention.

FIG. 78 is a graph showing the medium noise dependency on the recording density in Example 10-1 of the present invention.

FIG. 79 is a table showing the relationship between the film thickness and the medium noise in Example 10-1 of the present invention.

FIG. 80 is another table showing the relationship between the film thickness and the medium noise in Example 10-1 of the present invention.

FIG. 81 is yet another table showing the relationship between the film thickness and the medium noise in Example 10-1 of the present invention.

FIG. 82 is still another table showing the relationship between the film thickness and the medium noise in Example 10-1 of the present invention.

FIG. 83 is yet still another table showing the relationship between the film thickness and the medium noise in Example 10-1 of the present invention.

FIG. 84 is a graph showing the medium noise dependency on the recording density in Example 10-2 of the present invention.

FIG. 85 is a table showing the relationship between the film thickness and the medium noise in Example 10-2 of the present invention.

FIG. 86 is another table showing the relationship between the film thickness and the medium noise in Example 10-2 of the present invention.

FIG. 87 is yet another table showing the relationship between the film thickness and the medium noise in Example 10-2 of the present invention.

FIG. 88 is still another table showing the relationship between the film thickness and the medium noise in Example 10-2 of the present invention.

FIG. 89 is yet still another table showing the relationship between the film thickness and the medium noise in Example 10-2 of the present invention.

FIG. 90 is a table showing values of the perpendicular magnetic anisotropic energy Ku of the respective Examples of the present invention.

FIG. 91 is a graph showing the medium noise dependency on the recording density in Example 11 of the present invention.

FIG. 92 is a table showing the relationship between the film thickness and the medium noise in Example 11 of the present invention.

FIG. 93 is a graph showing the medium noise dependency on the recording density in Example 12 of the present invention.

FIG. 94 is a table showing the relationship between the film thickness and the medium noise in Example 12 of the present invention.

FIG. 95 is a graph showing the medium noise dependency on the recording density in Example 13 of the present invention.

FIG. 96 is a table showing the relationship between the film thickness and the medium noise in Example 13 of the present invention.

FIG. 97 is a graph showing the medium noise dependency on the recording density in Example 14 of the present invention.

FIG. 98 is a table showing the relationship between the film thickness and the medium noise in Example 14 of the present invention.

FIG. 99 is a graph showing the medium noise dependency on the recording density in Example 15 of the present invention.

FIG. 100 is a table showing the relationship between the film thickness and the medium noise in Example 15 of the present invention.

FIG. 101 is a graph showing the medium noise dependency on the recording density in Example 16 of the present invention.

FIG. 102 is a table showing the relationship between the film thickness and the medium noise in Example 16 of the present invention.

FIG. 103 is a graph showing the medium noise dependency on the recording density in Example 17 of the present invention.

FIG. 104 is a table showing the relationship between the film thickness and the medium noise in Example 17 of the present invention.

FIG. 105 is a graph showing the medium noise dependency on the recording density in Example 18 of the present invention.

FIG. 106 is a table showing the relationship between the film thickness and the medium noise in Example 18 of the present invention.

FIG. 107 is a graph showing the medium noise dependency on the recording density in Example 19 of the present invention.

FIG. 108 is a table showing the relationship between the film thickness and the medium noise in Example 19 of the present invention.

FIG. 109 is a graph showing the medium noise dependency on the recording density in Example 20 of the present invention.

FIG. 110 is a table showing the relationship between the film thickness and the medium noise in Example 20 of the present invention.

FIG. 111 is a table showing values of the perpendicular magnetic anisotropic energy Ku for the respective Examples of the present invention.

FIG. 112 is a graph showing the medium noise dependency on the recording density in Example 21 of the present invention.

FIG. 113 shows the relationship between the film thickness and the medium noise in Example 21 of the present invention.

FIG. 114 is a graph showing the medium noise dependency on the recording density in Example 22 of the present invention.

FIG. 115 shows the relationship between the film thickness and the medium noise in Example 22 of the present invention.

FIG. 116 is a graph showing the medium noise dependency on the recording density in Example 23 of the present invention.

FIG. 117 shows the relationship between the film thickness and the medium noise in Example 23 of the present invention.

FIG. 118 is a graph showing the medium noise dependency on the recording density in Example 24 of the present invention.

FIG. 119 shows the relationship between the film thickness and the medium noise in Example 24 of the present invention.

FIG. 120 is a graph showing the medium noise dependency on the recording density in Example 25 of the present invention.

FIG. 121 shows the relationship between the film thickness and the medium noise in Example 25 of the present invention.

FIG. 122 is a graph showing the medium noise dependency on the recording density in Example 26 of the present invention.

FIG. 123 shows the relationship between the film thickness and the medium noise in Example 26 of the present invention.

FIG. 124 is a graph showing the medium noise dependency on the recording density in Example 27 of the present invention.

FIG. 125 shows the relationship between the film thickness and the medium noise in Example 27 of the present invention.

FIG. 126 is a graph showing the medium noise dependency on the recording density in Example 28 of the present invention.

FIG. 127 shows the relationship between the film thickness and the medium noise in Example 28 of the present invention.

FIG. 128 is a graph showing the medium noise dependency on the recording density in Example 29 of the present invention.

FIG. 129 shows the relationship between the film thickness and the medium noise in Example 29 of the present invention.

FIG. 130 is a graph showing the medium noise dependency on the recording density in Example 30 of the present invention.

FIG. 131 shows the relationship between the film thickness and the medium noise in Example 30 of the present invention.

FIG. 132 is a graph showing the medium noise dependency on the recording density in Example 31 of the present invention.

FIG. 133 shows the relationship between the film thickness and the medium noise in Example 31 of the present invention.

FIG. 134 is a graph showing the medium noise dependency on the recording density in Example 32 of the present invention.

FIG. 135 shows the relationship between the film thickness and the medium noise in Example 32 of the present invention.

FIG. 136 is a graph showing the medium noise dependency on the recording density in Example 33 of the present invention.

FIG. 137 shows the relationship between the film thickness and the medium noise in Example 33 of the present invention.

FIG. 138 is a graph showing the medium noise dependency on the recording density in Example 34 of the present invention.

FIG. 139 shows the relationship between the film thickness and the medium noise in Example 34 of the present invention.

FIG. 140 is a graph showing the medium noise dependency on the recording density in Example 35 of the present invention.

FIG. 141 shows the relationship between the film thickness and the medium noise in Example 35 of the present invention.

FIG. 142 is a graph showing the medium noise dependency on the recording density in Example 36 of the present invention.

FIG. 143 shows the relationship between the film thickness and the medium noise in Example 36 of the present invention.

FIG. 144 is a graph showing the medium noise dependency on the recording density in Example 37 of the present invention.

FIG. 145 shows the relationship between the film thickness and the medium noise in Example 37 of the present invention.

FIG. 146 is a graph showing the medium noise dependency on the recording density in Example 38 of the present invention.

FIG. 147 shows the relationship between the film thickness and the medium noise in Example 38 of the present invention.

FIG. 148 is a graph showing the medium noise dependency on the recording density in Example 39 of the present invention.

FIG. 149 shows the relationship between the film thickness and the medium noise in Example 39 of the present invention.

FIG. 150 is a graph showing the medium noise dependency on the recording density in Example 40 of the present invention.

FIG. 151 shows the relationship between the film thickness and the medium noise in Example 40 of the present invention.

FIG. 152 is a graph showing the medium noise dependency on the recording density in Example 41 of the present invention.

FIG. 153 shows the relationship between the film thickness and the medium noise in Example 41 of the present invention.

FIG. 154 is a graph showing the medium noise dependency on the recording density in Example 42 of the present invention.

FIG. 155 shows the relationship between the film thickness and the medium noise in Example 42 of the present invention.

FIG. 156 is a cross sectional view of a conventional perpendicular magnetic recording medium.

DESCRIPTION OF THE PREFERRED EMBODIMENTS

FIG. 1 to FIG. 6 are cross sectional views of perpendicular magnetic recording media according to the present invention. FIG. 1 shows a perpendicular magnetic recording medium 11 including a perpendicular magnetization film 22 and a high perpendicular orientation film 24 formed in this order on a substrate 20. FIG. 2 shows a perpendicular magnetic recording medium 12 including a high perpendicular orientation film 24 and a perpendicular magnetization film formed in this order on a substrate 20. FIG. 3 shows a perpendicular magnetic recording medium 13 including a high perpendicular orientation film 24, a perpendicular magnetization film 22, and a high perpendicular orientation film 24 formed in this order on a substrate 20. FIG. 4 shows a perpendicular magnetic recording medium 14 including a backing soft magnetic film 26, a perpendicular magnetization film 22, and a high perpendicular orientation film 24 formed in this order on a substrate 20. FIG. 5 shows a perpendicular magnetic recording medium 15 including a backing soft magnetic film 26, a high perpendicular orientation film 24, and a perpendicular magnetization film 22 formed in this order on a substrate 20. FIG. 6 shows a perpendicular magnetic recording medium 15 including a backing soft magnetic film 26, a high perpendicular orientation film 24, a perpendicular magnetization film 22, and a high perpendicular orientation film 24 formed in this order on a substrate 20.

The high perpendicular orientation film 24 has a higher perpendicular orientation characteristic than the perpendicular magnetization film 22. The high perpendicular orientation film 24 may be made from: CoCrM alloys wherein M represents any three elements selected from a group consisting of Pt, Ta, La, Lu, Pr, and Sr; RCo₅ wherein R represents any one of Y, Ce, Sm, La, and Pr; R₂Co₁₇ wherein R represents any one of Y, Ce, Sm, La, and Pr; Ba ferrite, Sr ferrite, PtCo, and the like.

The high perpendicular orientation film 24 made from the aforementioned materials is provided at least over or under the perpendicular magnetization film 22. This reduces effects of the demagnetizing field generated by the magnetic pole on the surface of the perpendicular magnetization film 22. Accordingly, it is possible to obtain a perpendicular magnetic recording medium having a preferable noise characteristic even in the low recording density region.

EXAMPLE 1

Using a 6-inch Co₈₀Cr₁₇Ta₃ (%) target for sputtering, a perpendicular magnetization film Co₈₀Cr₁₇Ta₃ was formed to have a thickness of 100 nm on a 2.5-inch substrate at 400 degrees centigrade. The film formation conditions were as follows: initial vacuum degree 5×10⁷ [mTorr]; electric power 0.5 [kw]; argon gas pressure 4 [mTorr]; film formation speed 3 [nm/sec].

After this, the film was covered by the high perpendicular orientation film of 5 to 55 [nm] thickness formed by using: a Co₇₄Cr₂₂Pt₂TaLa target, a Co₇₅Cr₂₁Pt₂TaLa target, a Co₇₆Cr₂₀Pt₂TaLa target, a Co₇₇Cr₁₉Pt₂TaLa target, and a Co₇₈Cr₁₈Pt₂TaLa target.

After this, a C (carbon) protection film 10 [nm] was formed to cover the high perpendicular orientation film.

The medium having the high perpendicular orientation film of Co₇₆Cr₂₀Pt₂TaLa of 50 [nm] thickness will be referred to as medium AAA2 of the present invention. On the other hand, the medium having only the perpendicular magnetization film Co₈₀Cr₁₇Ta₃ without forming the high perpendicular orientation film of Co₇₆Cr₂₀Pt₂TaLa will be referred to as a conventional medium (comparative example) D1.

It should be noted we also prepared a medium having the Co₇₆Cr₂₀Pt₂TaLa film and the Co₈₀Cr₁₇Ta₃ film in the reversed order. That is, firstly, Co₇₆Cr₂₀Pt₂TaLa film was formed on the substrate, and then the Co₈₀Cr₁₇Ta₃ film was formed on the Co₇₆Cr₂₀Pt₂TaLa film.

The perpendicular magnetic anisotropic energy Ku of the following seven films were measured using a torque magnetometer; and saturation magnetization Ms of the seven films were measured using a sample vibration type magnetometer (VSM): a Co₇₄Cr₂₂Pt₂TaLa film, a Co₇₅Cr₂₁Pt₂TaLa film, a Co₇₆Cr₂₀Pt₂TaLa film, a Co₇₇Cr₁₉Pt₂TaLa film, a Co₇₈Cr₁₈Pt₂TaLa film, a Co₇₈Cr₁₉Ta₃ film, and a Co₈₀Cr₁₇Ta₃ film. The measurement results are shown in FIG. 7.

In general, a magnetic film can be a perpendicular magnetization film if the perpendicular anisotropy magnetic field Hk is greater than the maximum perpendicular magnetic field 4pMs (p represents the number ^(π)) so as to satisfy the relationship of Hk≧4pMs. Moreover, the perpendicular anisotropy magnetic field Hk can be expressed by using the perpendicular magnetic anisotropic energy Ku, i.e., Hk=2Ku/Ms. That is, the quality of the perpendicular orientation of the perpendicular magnetization film can be determined by finding which is greater Hk or 4pMs. Here, R is assumed to be Hk/4pMs, and the R values are shown in the table of FIG. 7.

The Co₈₀Cr₁₇Ta₃ film has R=1.1 whereas the Co₇₆Cr₂₀Pt₂TaLa film has R=1.4. That is the Co₇₆Cr₂₀Pt₂TaLa film has by far better perpendicular magnetic anisotropy than the Co₈₀Cr₁₇Ta₃ film. However, if the percentage content of the Co is 73% or below, the Co alloy does not show the ferromagnetic characteristic. Accordingly, it is impossible to lower the Co content without limit.

On the other hand, by using the ID (inductive)/MR(magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium AAA2 of the present invention and the conventional medium D1. The check conditions were set as follows: ID/MR composite head recording track width 4 [micrometers], the reproduction track width 3 [micrometers], recording gap length 0.4 [micrometers], and reproduction gap length 0.32 [micrometers]. Evaluation of the check was performed under the conditions of: recording current 19 [mAop], sense current 12 [mA], peripheral velocity 12.7 [m/s], floating amount 45 [nm], and noise bandwidth 50 [MHz].

FIG. 8 shows the medium noise dependency on the recording density for the AAA2 of the present invention and the conventional D1. As is clear from FIG. 8, the conventional medium D1 shows a very high medium noise in the lower recording density, whereas in the medium AAA2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium D1. This is because the medium AAA2 of the present invention includes a film having a preferable perpendicular magnetic anisotropy on the perpendicular magnetization film of Co₈₀Cr₁₇Ta₃. Accordingly, in contrast to the conventional D1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 9 to FIG. 13. As is clear from FIG. 9 to FIG. 13, when the value R (Hk/4pMs) is smaller than 1.4, medium noise cannot be improved even if the film thickness is reduced. This is because if R is below 1.4, the perpendicular orientation characteristic is insufficient and it is impossible to sufficiently suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. On the other hand, if the film satisfies the relationship that R is equal to or greater than 1.4, the medium noise is reduced up to the film thickness 50 [nm] for all the film types. As has been described above, if a film satisfies the relationship that R is equal to or greater than 1.4, it is possible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. However, even if the film satisfies the aforementioned relationship, the medium noise reduction cannot be seen when the film thickness exceeds 50 [nm]. This is because of the fact that if the film thickness is too great, the orientation perpendicular to the film surface is deteriorated and it is impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the recording medium AAA2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the AAA2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region. Moreover, when the Co₇₆Cr₂₀Pt₂TaLa film is provided under or both under and over the perpendicular magnetization film, similar results can be obtained because of the aforementioned reasons. Furthermore, film types other than the Co₇₆Cr₂₀Pt₂TaLa film can also have similar results if the relationship that R is equal to or more than 1.4 is satisfied.

EXAMPLE 2

Media of Example 2 were prepared in the same way as Example 1 except for that the Co_(x)Cr_(96−x)Pt₂TaLa (74≦×≦78) target was replaced by Co_(x)Cr_(96−x)Pt₂TaLu (74≦×≦78) target. The medium examples made from Co₇₆Cr₂₀Pt₂TaLu film having a film thickness of 50 [nm] will be referred to as medium BBB2 of the present invention. Note that we also prepared media having the Co₈₀Cr₁₇Ta₃ film and the Co₇₆Cr₂₀Pt₂TaLu film in the reversed order, i.e., firstly Co₇₆Cr₂₀Pt₂TaLu film was formed on the substrate, and then the Co₈₀Cr₁₇Ta₃ film was formed thereon.

The perpendicular magnetic anisotropic energy Ku of the following six films were measured using a torque magnetometer; and saturation magnetization Ms of these six films were measured using a sample vibration type magnetometer (VSM): a Co₇₄Cr₂₂Pt₂TaLu film, a Co₇₅Cr₂₁Pt₂TaLu film, a Co₇₆Cr₂₀Pt₂TaLu film, a Co₇₇Cr₁₉Pt₂TaLu film, a Co₇₈Cr₁₈Pt₂TaLu film, and a Co₈₀Cr₁₇Ta₃ film. The check results are shown in FIG. 14 and FIG. 7.

Here, R is defined as Hk/4pMs in the same way as in Example 1. FIG. 14 shows the R values for each of the films. The Co₈₀Cr₁₇Ta₃ film has R=1.1 whereas the Co₇₆Cr₂₀Pt₂TaLu film has R=1.4. That is, the Co₇₆Cr₂₀Pt₂TaLu film shows by far more preferable perpendicular magnetic anisotropy than the Co₈₀Cr₁₇Ta₃ film. However, the Co alloy film having Co content 73 or below does not show the ferromagnetic characteristic. Accordingly, it is impossible to reduce the Co content without limit.

The ID/MR composite head was used to check the recording/reproduction characteristic of the medium BBB2 of the present invention and the conventional medium (comparative example) D1. The head and the recording/reproduction conditions were set in the same way as in Example 1.

FIG. 15 shows the medium noise dependency on the recording density for the BBB2 of the present invention and the conventional medium D1. As is clear from FIG. 15, the conventional medium D1 has a very high noise in the low recording medium region, whereas the medium BBB2 of the present invention shows noise by far lower than the conventional medium D1 in the low recording density region. This is because the BBB2 has a preferable film of perpendicular magnetic anisotropy on the perpendicular magnetization film of Co₈₀Cr₁₇Ta₃ and it is possible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film much more than the conventional medium D1.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 16 to FIG. 20. As is clear from FIG. 16 to FIG. 20, when the value R (Hk/4pMs) is smaller than 1.4, medium noise cannot be improved even if the film thickness is reduced. This is because if R is below 1.4, the perpendicular orientation characteristic is insufficient and it is difficult to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. On the other hand, if the film satisfies the relationship that R is equal to or greater than 1.4, the medium noise is reduced up to the film thickness 50 [nm] for all the film types. As has been described above, in the film which satisfies the relationship that R is equal to or greater than 1.4, it is possible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. However, even if the film satisfies the aforementioned relationship, the medium noise reduction cannot be seen when the film thickness exceeds 50 [nm]. This is because of the fact that if the film thickness is too great, the orientation perpendicular to the film surface is deteriorated and it is impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the recording medium BBB2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the BBB2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region. Moreover, when the Co₇₆Cr₂₀Pt₂TaLu film is provided under or both under and over the perpendicular magnetization film, similar results can be obtained because of the aforementioned reasons. Furthermore, film types other than the Co₇₆Cr₂₀Pt₂TaLu film can also have similar results if the relationship that R is equal to or more than 1.4 is satisfied.

EXAMPLE 3

Media of Example 3 were prepared in the same way as Example 1 except for that the Co_(x)Cr_(96−x)Pt₂TaLa (74≦×≦78) target was replaced by Co_(x)Cr_(96−x)Pt₂LaLu (74≦×≦78) target. The medium examples made from Co₇ 6Cr₂₀Pt₂LaLu film having a film thickness of 50 [nm] will be referred to as medium CCC2 of the present invention. Note that we also prepared media having the Co₈₀Cr₁₇Ta₃ film and Co₇₆Cr₂₀Pt₂LaLu film in the reversed order, i.e., firstly Co₇₆Cr₂₀Pt₂LaLu film was formed on the substrate, and then the Co₈₀Cr₁₇Ta₃ film was formed thereon.

The perpendicular magnetic anisotropic energy Ku of the following six films were measured using a torque magnetometer; and saturation magnetization Ms of these six films were measured using a sample vibration type magnetometer (VSM): a Co₇₄Cr₂₂Pt₂LaLu film, a Co₇₅Cr₂₁Pt₂LaLu film, a Co₇₆Cr₂₀Pt₂LaLu film, a Co₇₇Cr₁₉Pt₂LaLu film, a Co₇₈Cr₁₈Pt₂LaLu film, and a Co₈₀Cr₁₇Ta₃ film. The check results are shown in FIG. 21 and FIG. 7.

Here, R is defined as Hk/4pMs in the same way as in Example 1. FIG. 21 shows the R values for each of the films. The Co₈₀Cr₁₇Ta₃ film has R=1.1 whereas the Co₇₆Cr₂₀Pt₂LaLu film has R=1.4. That is, the Co₇₆Cr₂₀Pt₂LaLu film shows by far more preferable perpendicular magnetic anisotropy than the Co₈₀Cr₁₇Ta₃ film. However, the Co alloy film having a Co percentage content of 73% or below does not show the ferromagnetic characteristic. Accordingly, it is impossible to reduce the Co content without limit.

The ID/MR composite head was used to check the recording/reproduction characteristic of the medium CCC2 of the present invention and the conventional medium (comparative example) D1. The head and the recording/reproduction conditions were set in the same way as in Example 1.

FIG. 22 shows the medium noise dependency on the recording density for the CCC2 of the present invention and the conventional medium D1. As is clear from FIG. 22, the conventional medium D1 has a very high noise in the low recording medium region, whereas the medium CCC2 of the present invention shows noise by far lower than the conventional medium D1 in the low recording density region. This is because the CCC2 has a preferable film of perpendicular magnetic anisotropy on the perpendicular magnetization film of Co₈₀Cr₁₇Ta₃ and it is possible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film much more than the conventional medium D1.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 23 to FIG. 27. As is clear from FIG. 23 to FIG. 27, when the value R (Hk/4pMs) is smaller than 1.4, medium noise cannot be improved even if the film thickness is reduced. This is because if R is below 1.4, the perpendicular orientation characteristic is insufficient and it is difficult to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. On the other hand, if the film satisfies the relationship that R is equal to or greater than 1.4, i.e., R≧1.4, the medium noise is reduced up to the film thickness 50 [nm] for all the film types. As has been described above, in the film which satisfies the relationship that R is equal to or greater than 1.4, it is possible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. However, even if the film satisfies the aforementioned relationship, the medium noise reduction cannot be seen when the film thickness exceeds 50 [nm]. This is because of the fact that if the film thickness is too great, the orientation perpendicular to the film surface is deteriorated and it is impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the recording medium CCC2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the CCC2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region. Moreover, when the Co₇₆Cr₂₀Pt₂LaLu film is provided under or both under and over the perpendicular magnetization film, similar results can be obtained because of the aforementioned reasons. Furthermore, film types other than the Co₇₆Cr₂₀Pt₂LaLu film can also have similar results if the relationship that R is equal to or more than 1.4 is satisfied.

EXAMPLE 4-1

Media of Example 4-1 were prepared in the same way as Example 1 except for that the Co_(x)Cr_(96−x)Pt₂TaLa (74≦×≦78) target was replaced by Co_(x)Cr_(96−x)Ta₂LaLu (74≦×≦78) target. The medium examples made from Co₇₆Cr₂₀Ta₂LaLu film having a film thickness of 50 [nm] will be referred to as medium DDD2 of the present invention. Note that we also prepared media having the Co₈₀Cr₁₇Ta₃ film and Co₇₆Cr₂₀Ta₂LaLu film in the reversed order, i.e., firstly Co₇₆Cr₂₀Ta₂LaLu film was formed on the substrate, and then the Co₈₀Cr₁₇Ta₃ film was formed thereon.

FIG. 28 and FIG. 7 show the perpendicular magnetic anisotropic energy Ku and saturation magnetization Ms of the six films: a Co₇₄Cr₂₂Ta₂LaLu film, a Co₇₅Cr₂₁Ta₂LaLu film, a Co₇₆Cr₂₀Ta₂LaLu film, a Co₇₇Cr₁₉Ta₂LaLu film, a Co₇₈Cr₁₈Ta₂LaLu film, and a Co₈₀Cr₁₇Ta₃ film.

Here, the R is defined in the same way as in Example 1. FIG. 28 shows the respective R values. The Co₈₀Cr₁₇Ta₃ film has R=1.1, whereas the Co₇₆Cr₂₀Ta₂LaLu film, for example, has R=1.4. That is, the Co₇₆Cr₂₀Ta₂LaLu film has by far preferable perpendicular magnetic compared to the Co₈₀Cr₁₇Ta₃ film. However, if Co content is equal to or below 73, the Co alloy does not exhibit the ferromagnetic characteristic. Accordingly, it is impossible to reduce the Co content without limit.

The ID/MR composite head was used to check the reproduction characteristic of the DDD2 of the present invention and the conventional medium D1. The head and the recording/reproduction conditions were set the same as in Example 1.

FIG. 29 shows the medium noise dependency on the recording density for the DDD2 of the present invention and the conventional medium D1. As is clear from FIG. 29, the conventional medium D1 has a very high noise in the low recording medium region, whereas the medium DDD2 of the present invention shows noise by far lower than the conventional medium D1 in the low recording density region. This is because the DDD2 has a preferable film of perpendicular magnetic anisotropy on the perpendicular magnetization film of Co₈₀Cr₁₇Ta₃ and it is possible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film much more than the conventional medium D1.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 30 to FIG. 34. As is clear from FIG. 30 to FIG. 34, when the value R (Hk/4pMs) is smaller than 1.4, medium noise cannot be improved (reduced) even if the film thickness is reduced. This is because if R is below 1.4, the perpendicular orientation characteristic is insufficient and it is difficult to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. On the other hand, if the film satisfies the relationship that R is equal to or greater than 1.4, i.e., R≧1.4, the medium noise is reduced up to the film thickness 50 [nm] for all the film types. As has been described above, in the film which satisfies the relationship that R is equal to or greater than 1.4, it is possible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. However, even if the film satisfies the aforementioned relationship, the medium noise reduction cannot be seen when the film thickness exceeds 50 [nm]. This is because of the fact that if the film thickness is too great, the orientation perpendicular to the film surface is deteriorated and it is impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the recording medium DDD2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the DDD2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region. Moreover, when the Co₇₆Cr₂₀Ta₂LaLu film is provided under or both under and over the perpendicular magnetization film, similar results can be obtained because of the aforementioned reasons. Furthermore, film types other than the Co₉₆Cr₂₀Ta₂LaLu film can also have similar results if the relationship that R is equal to or more than 1.4 is satisfied.

EXAMPLE 4-2

Media of Example 4-1 were prepared in the same way as Example 1 except for that the Co_(x)Cr_(96−x)Pt₂TaLa (74≦×≦78) target was replaced by Co_(x)Cr_(96−x)Ta₂PrSr (74≦×≦78) target. The medium examples made from Co₇₆Cr₂₀Ta₂PrSr film having a film thickness of 50 [nm] will be referred to as medium DDD3 of the present invention. Note that we also prepared media having the Co₈₀Cr₁₇Ta₃ film and Co₇₆Cr₂₀Ta₂PrSr film in the reversed order, i.e., firstly Co₇₆Cr₂₀Ta₂PrSr film was formed on the substrate, and then the Co₈₀Cr₁₇Ta₃ film was formed thereon.

The perpendicular magnetic anisotropic energy Ku of the following six films were measured using a torque magnetometer; and saturation magnetization Ms of these six films were measured using a sample vibration type magnetometer (VSM): i.e., a Co₇₄Cr₂₂Ta₂PrSr film, a Co₇₅Cr₂₁Ta₂PrSr film, a Co₇₆Cr₂₀Ta₂PrSr film, a Co₇₇Cr₁₉Ta₂PrSr film, a Co₇₈Cr₁₈Ta₂PrSr film, and a Co₈₀Cr₁₇Ta₃ film. The check results are shown in FIG. 35 and FIG. 7.

Here, R is defined as Hk/4pMs in the same way as in Example 1. FIG. 35 shows the R values for each of the films. The Co₈₀Cr₁₇Ta₃ film has R=1.1 whereas the Co₇₆Cr₂₀Ta₂PrSr film has R=1.4. That is, the Co₇₆Cr₂₀Ta₂PrSr film shows by far more preferable perpendicular magnetic anisotropy than the Co₈₀Cr₁₇Ta₃ film. However, the Co alloy film having a Co percentage content of 73% or below does not show the ferromagnetic characteristic. Accordingly, it is impossible to reduce the Co content without limit.

The ID/MR composite head was used to check the recording/reproduction characteristic of the medium DDD3 of the present invention and the conventional medium (comparative example) D1. The head and the recording/reproduction conditions were set in the same way as in Example 1.

FIG. 36 shows the medium noise dependency on the recording density for the DDD3 of the present invention and the conventional medium D1. As is clear from FIG. 36, the conventional medium D1 has a very high noise in the low recording medium region, whereas the medium DDD3 of the present invention shows noise by far lower than the conventional medium D1 in the low recording density region. This is because the DDD3 has a preferable film of perpendicular magnetic anisotropy on the perpendicular magnetization film of Co₈₀Cr₁₇Ta₃ and it is possible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film much more than the conventional medium D1.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 37 to FIG. 41. As is clear from FIG. 37 to FIG. 41, when the value R (Hk/4pMs) is smaller than 1.4, medium noise cannot be improved (reduced) even if the film thickness is reduced. This is because if R is below 1.4, the perpendicular orientation characteristic is insufficient and it is difficult to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. On the other hand, if the film satisfies the relationship that R is equal to or greater than 1.4, i.e., R≧1.4, the medium noise is reduced up to the film thickness 50 [nm] for all the film types. As has been described above, in the film which satisfies the relationship that R is equal to or greater than 1.4, it is possible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. However, even if the film satisfies the aforementioned relationship, the medium noise reduction cannot be seen when the film thickness exceeds 50 [nm]. This is because of the fact that if the film thickness is too great, the orientation perpendicular to the film surface is deteriorated and it is impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the recording medium DDD3 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the DDD3 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region. Moreover, when the Co₇₆Cr₂₀Ta₂PrSr film is provided under or both under and over the perpendicular magnetization film, similar results can be obtained because of the aforementioned reasons. Furthermore, film-types other than the Co₇₆Cr₂₀Ta₂PrSr film can also have similar results if the relationship that R is equal to or more than 1.4 is satisfied.

EXAMPLE 5

Using a 6-inch FeSiAl target for sputtering, a FeSiAl film was formed with a thickness of 500 [nm] on 2.5-inch substrates. The film formation conditions were as follows: initial vacuum degree 5×10⁻⁷ [mTorr]; electric power 0.5 [kw]; argon gas pressure 4 [mTorr]; film formation speed 3 [nm/sec].

Then, each of the FeSiAl films on the substrates at temperature of 400 degrees centigrade was covered by 100 [nm] of Co₈₀Cr₁₇Ta₃ film formed by using a Co₈₀Cr₁₇Ta₃ target under the same film formation conditions as FeSiAl.

Next, the Co₈₀Cr₁₇Ta₃ films were respectively covered by 5 to 55 [nm] thickness of a Co₇₄Cr₂₂Pt₂TaLa film, a Co₇₅Cr₂₁Pt₂TaLa film, a Co₇₆Cr₂₀Pt₂TaLa film, a Co₇₇Cr₁₉Pt₂TaLa film, and a Co₇₇Cr₁₉Pt₂TaLa film by using the corresponding targets. Furthermore, a C (carbon) protection film of 10 [nm] was formed to cover the aforementioned films.

The medium having the Co₇₆Cr₂₀Pt₂TaLa film of 50 [nm] will be referred to as AAAA2 of the present invention. On the other hand, the medium having only the Co₈₀Cr₁₇Ta₃ film on the FeSiAl film without forming the Co₇₆Cr₂₀Pt₂TaLa film will be referred to as a conventional medium (comparative example) E1.

It should be noted we also prepared a medium having the Co₇₆Cr₂₀Pt₂TaLa film and the Co₈₀Cr₁₇Ta₃ film in the reversed order. That is, firstly, Co₇₆Cr₂₀Pt₂TaLa film was formed on the substrate, and then the Co₈₀Cr₁₇Ta₃ film was formed on the Co₇₆Cr₂₀Pt₂TaLa film.

FIG. 7 shows the perpendicular magnetic anisotropic energy Ku and saturation magnetization Ms of the Co₇₄Cr₂₂Pt₂TaLa film, the Co₇₅Cr₂₁Pt₂TaLa film, the Co₇₆Cr₂₀Pt₂TaLa film, the Co₇₇Cr₁₉Pt₂TaLa film, the Co₇₈Cr₁₈Pt₂TaLa film, and the Co₈₀Cr₁₇Ta₃ film.

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium AAAA2 of the present invention and the conventional medium E1. The check conditions were set as follows: mono-pole head recording track width 4 [micrometers], the main magnetic pole film thickness 0.4 [micrometers], reproduction track width 3 [micrometers], and reproduction gap length 0.32 [micrometers]. Note that the check was performed under the condition of: recording current 10 [mAop], sense current 12 [mA], peripheral velocity 12.7 [m/s], and floating amount 45 [nm].

FIG. 42 shows the medium noise dependency on the recording density for the AAAA2 of the present invention and the conventional medium E1. As is clear from FIG. 42, the conventional medium E1 shows a very high medium noise in the lower recording density, whereas in the medium AAAA2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium E1. This is because the medium AAAA2 of the present invention includes a film having a preferable perpendicular magnetic anisotropy on the perpendicular magnetization film of Co₈₀Cr₁₇Ta₃. Accordingly, in contrast to the conventional E1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. Note that the FeSiAl film has no magnetic domain wall structure and the spike-shaped noise is not generated easily due to the magnetic domain wall movement.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 43 to FIG. 47. As is clear from FIG. 43 to FIG. 47, when the value R (Hk/4pMs) is smaller than 1.4, medium noise cannot be improved (reduced) even if the film thickness is reduced. This is because if R is below 1.4, the perpendicular orientation characteristic is insufficient and it is impossible to sufficiently suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

On the other hand, if the film satisfies the relationship that R is equal to or greater than 1.4, the medium noise is reduced up to the film thickness 50 [nm] for all the film types. As has been described above, if a film satisfies the relationship that R is equal to or greater than 1.4, it is possible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. However, even if the film satisfies the aforementioned relationship, the medium noise reduction cannot be seen when the film thickness exceeds 50 [nm]. This is because of the fact that if the film thickness is too great, the orientation perpendicular to the film surface is deteriorated and it is impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the recording medium AAAA2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the AAAA2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region. Moreover, when the Co₇₆Cr₂₀Pt₂TaLa film is provided under or both under and over the perpendicular magnetization film, similar results can be obtained because of the aforementioned reasons. Furthermore, film types other than the Co₇₆Cr₂₀Pt₂TaLa film can also have similar results if the relationship that R is equal to or more than 1.4 is satisfied.

Moreover, in the experiment using the ID/MR composite head used in Example 1 instead of the mono-pole composite head, similar results were obtained because of the aforementioned reasons.

EXAMPLE 6

Media of Example 6 were prepared in the same way as Example 5 except for that the Co_(x)Cr_(96−x)Pt₂TaLa (74≦×≦78) target was replaced by Co_(x)Cr_(96−x)Ta₂TaLu (74≦×≦78) target. The medium examples made from Co₇₆Cr₂₀Pt₂TaLu film having a film thickness of 50 [nm] will be referred to medium BBBB2 of the present invention. Note that we also prepared media having the Co₈₀Cr₁₇Ta₃ film and Co₇₆Cr₂₀Ta₂LaLu film in the reversed order, i.e., firstly Co₇₆Cr₂₀Ta₂LaLu film was formed on the substrate, and then the Co₈₀Cr₁₇Ta₃ film was formed thereon.

FIG. 7 shows the perpendicular magnetic anisotropic energy Ku and saturation magnetization Ms of the Co₇₄Cr₂₂Pt₂TaLu film, the Co₇₅Cr₂₁Pt₂TaLu film, the Co₇₆Cr₂₀Pt₂TaLu film, the Co₇₇Cr₁₉Pt₂TaLu film, the Co₇₈Cr₁₈Pt₂TaLu film, and the Co₈₀Cr₁₇Ta₃ film.

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium BBBB2 of the present invention and the conventional medium E1. The check conditions and head characteristics were the same as in Example 5.

FIG. 48 shows the medium noise dependency on the recording density for the BBBB2 of the present invention and the conventional medium E1. As is clear from FIG. 48, the conventional medium E1 shows a very high medium noise in the lower recording density, whereas in the medium BBBB2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium E1. This is because the medium BBBB2 of the present invention includes a film having a preferable perpendicular magnetic anisotropy on the perpendicular magnetization film of Co₈₀Cr₁₇Ta₃. Accordingly, in contrast to the conventional E1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. Note that the FeSiAl film has no magnetic domain wall structure and the spike-shaped noise is not easily caused by the magnetic domain wall movement.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 49 to FIG. 53. As is clear from FIG. 49 to FIG. 53, when the value R (Hk/4pMs) is smaller than 1.4, medium noise cannot be improved (reduce) even if the film thickness is reduced. This is because if R is below 1.4, the perpendicular orientation characteristic is insufficient and it is impossible to sufficiently suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

On the other hand, if the film satisfies the relationship that R is equal to or greater than 1.4, the medium noise is reduced up to the film thickness 50 [nm] for all the film types. As has been described above, if a film satisfies the relationship that R is equal to or greater than 1.4, it is possible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. However, even if the film satisfies the aforementioned relationship, the medium noise reduction cannot be seen when the film thickness exceeds 50 [nm]. This is because of the fact that if the film thickness is too great, the orientation perpendicular to the film surface is deteriorated and it is impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the recording medium BBBB2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the BBBB2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region.

Moreover, when the Co₇₆Cr₂₀Pt₂TaLu film is provided under or both under and over the perpendicular magnetization film, similar results can be obtained because of the aforementioned reasons. Furthermore, film types other than the Co₇₆Cr₂₀Pt₂TaLu film can also have similar results if the relationship that R is equal to or more than 1.4 is satisfied.

EXAMPLE 7

Media of Example 7 were prepared in the same way as Example 5 except for that the Co_(x)Cr_(96−x)Pt₂TaLa (74≦×≦78) target was replaced by Co_(x)Cr_(96−x)Pt₂LaLu (74≦×≦78) target. The medium examples made from Co₇₆Cr₂₀Pt₂LaLu film having a film thickness of 50 [nm] will be referred to medium CCCC2 of the present invention. Note that we also prepared media having the Co₈₀Cr₁₇Ta₃ film and Co₇₆Cr₂₀Pt₂LaLu film in the reversed order, i.e., firstly Co₇₆Cr₂₀Pt₂LaLu film was formed on the substrate, and then the Co₈₀Cr₁₇Ta₃ film was formed thereon.

FIG. 21 and FIG. 7 shows the perpendicular magnetic anisotropic energy Ku and saturation magnetization Ms of the Co₇₄Cr₂₂Pt₂LaLu film, the Co₇₅Cr₂₁Pt₂zLaLu film, the Co₇₆Cr₂₀Pt₂LaLu film, the Co₇₇Cr₁₉Pt₂LaLu film, the Co₇₈Cr₁₈Pt₂LaLu film, and the Co₈₀Cr₁₇Ta₃ film.

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium CCCC2 of the present invention and the conventional medium E1. The check conditions and head characteristics were the same as in Example 5.

FIG. 54 shows the medium noise dependency on the recording density for the CCCC2 of the present invention and the conventional medium E1. As is clear from FIG. 54, the conventional medium E1 shows a very high medium noise in the lower recording density, whereas in the medium CCCC2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium E1. This is because the medium CCCC2 of the present invention includes a film having a preferable perpendicular magnetic anisotropy on the perpendicular magnetization film of Co₈₀Cr₁₇Ta₃. Accordingly, in contrast to the conventional E1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. Note that the FeSiAl film has no magnetic domain wall structure and the spike-shaped noise is not easily caused by the magnetic domain wall movement.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 55 to FIG. 59. As is clear from FIG. 55 to FIG. 59, when the value R (Hk/4pMs) is smaller than 1.4, medium noise cannot be improved even if the film thickness is reduced. This is because if R is below 1.4, the perpendicular orientation characteristic is insufficient and it is impossible to sufficiently suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

On the other hand, if the film satisfies the relationship that R is equal to or greater than 1.4, the medium noise is r educed up to the film thickness 50 [nm] for all the film types. As has been described above, if a film satisfies the relationship that R is equal to or greater than 1.4, it is possible to suppress generation of a reverse d magnetic domain in the vicinity of the surface of the perpendicular magnetization film. However, even if the film satisfies the aforementioned relationship, the medium noise reduction cannot be seen when the film thickness exceeds 50 [nm]. This is because of the fact that if the film thickness is too great, the orientation perpendicular to the film surface is deteriorated and it is impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the recording medium CCCC2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the CCCC2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region. Moreover, when the Co₇₆Cr₂₀Pt₂LaLu film is provided under or both under and over the perpendicular magnetization film, similar results can be obtained because of the aforementioned reasons. Furthermore, film types other than the Co₇₆Cr₂₀Pt₂LaLu film can also have similar results if the relationship that R is equal to or more than 1.4 is satisfied.

Moreover, experiments were performed using the ID/MR composite head used in Example 1, instead of the mono-pole/MR composite head. The experiments showed results similar to the aforementioned results.

EXAMPLE 8-1

Media of Example 8-1 were prepared in the same way as Example 5 except for that the Co_(x)Cr_(96−x)Pt₂TaLa (74≦×≦78) target was replaced by Co_(x)Cr_(96−x)Ta₂LaLu (74 ≦×≦78) target. The medium examples made from Co₇₆Cr₂₀Ta₂LaLu film having a film thickness of 50 [nm] will be referred to as medium DDDD2 of the present invention. Note that we also prepared media having the Co₈₀Cr₁₇Ta₃ film and Co₇₆Cr₂₀Ta₂LaLu film in the reversed order, i.e., firstly Co₇₆Cr₂₀Ta₂LaLu film was formed on the substrate, and then the Co₈₀Cr₁₇Ta₃ film was formed thereon.

FIG. 28 and FIG. 7 show the perpendicular magnetic anisotropic energy Ku and saturation magnetization Ms of the Co₇₄Cr₂₂Ta₂LaLu film, the Co₇₅Cr₂₁Ta₂LaLu film, the Co₇₆Cr₂₀Ta₂LaLu film, the Co₇₇Cr₁₉Ta₂LaLu film, the Co₇₈Cr₁₈Ta₂LaLu film, and the Co₈₀Cr₁₇Ta₃ film.

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium DDDD2 of the present invention and the conventional medium E1. The check conditions and head characteristics were the same as in Example 5.

FIG. 60 shows the medium noise dependency on the recording density for the DDDD2 of the present invention and the conventional medium E1. As is clear from FIG. 60, the conventional medium E1 shows a very high medium noise in the lower recording density, whereas in the medium DDDD2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium E1. This is because the medium DDDD2 of the present invention includes a film having a preferable perpendicular magnetic anisotropy on the perpendicular magnetization film of Co₈₀Cr₁₇Ta₃. Accordingly, in contrast to the conventional E1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. Note that the FeSiAl film has no magnetic domain wall structure and the spike-shaped noise is not easily caused by the magnetic domain wall movement.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 61 to FIG. 65. As is clear from FIG. 61 to FIG. 65, when the value R (Hk/4pMs) is smaller than 1.4, medium noise cannot be improved (reduced) even if the film thickness is reduced. This is because if R is below 1.4, the perpendicular orientation characteristic is insufficient and it is impossible to sufficiently suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. On the other hand, if the film satisfies the relationship that R is equal to or greater than 1.4, the medium noise is reduced up to the film thickness 50 [nm] for all the film types. As has been described above, if a film satisfies the relationship that R is equal to or greater than 1.4, it is possible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. However, even if the film satisfies the aforementioned relationship, the medium noise reduction cannot be seen when the film thickness exceeds 50 [nm]. This is because of the fact that if the film thickness is too great, the orientation perpendicular to the film surface is deteriorated and it is impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the recording medium DDDD2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the DDDD2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region. Moreover, when the Co₇₆Cr₂₀Ta₂LaLu film is provided under or both under and over the perpendicular magnetization film, similar results can be obtained because of the aforementioned reasons. Furthermore, film types other than the Co₇₆Cr₂₀Ta₂LaLu film can also have similar results if the relationship that R is equal to or more than 1.4 is satisfied.

Moreover, experiment was performed using the ID/MR composite head used in Example 1, instead of the mono-pole/MR composite head. The experiment showed results similar to the aforementioned results.

EXAMPLE 8-2

Media of Example 8-2 were prepared in the same way as Example 5 except for that the Co_(x)Cr_(96−x)Pt₂TaLa (74≦×≦78) target was replaced by Co_(x)Cr_(96−x)Ta₂PrSr (74≦×≦78) target. The medium examples made from Co₇₆Cr₂₀Ta₂PrSr film having a film thickness of 50 [nm] will be referred to as medium DDDD3 of the present invention. Note that we also prepared media having the Co₈₀Cr₁₇Ta₃ film and Co₇₆Cr₂Ta₂PrSr film in the reversed order, i.e., firstly Co₇₆Cr₂₀Ta₂PrSr film was formed on the substrate, and then the Co₈₀Cr₁₇Ta₃ film was formed thereon.

FIG. 35 and FIG. 7 shows the perpendicular magnetic anisotropic energy Ku and saturation magnetization Ms of the Co₇₄Cr₂₂Ta₂PrSr film, the Co₇₅Cr₂₁Ta₂PrSr film, the Co₇₆Cr₂₀Ta₂PrSr film, the Co₇₇Cr₁₉Ta₂PrSr film, the Co₇₈Cr₁₈Ta₂LaLu film, and the Co₈₀Cr₁₇Ta₃ film.

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium DDDD3 of the present invention and the conventional medium E1. The check conditions and head characteristics were the same as in Example 5.

FIG. 66 shows the medium noise dependency on the recording density for the DDDD3 of the present invention and the conventional medium E1. As is clear from FIG. 66, the conventional medium E1 shows a very high medium noise in the lower recording density, whereas in the medium DDDD3 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium E1. This is because the medium DDDD3 of the present invention includes a film having a preferable perpendicular magnetic anisotropy on the perpendicular magnetization film of Co₈₀Cr₁₇Ta₃. Accordingly, in contrast to the conventional E1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. Note that the FeSiAl film has no magnetic domain wall structure and the spike-shaped noise is not easily caused by the magnetic domain wall movement.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 67 to FIG. 71. As is clear from FIG. 67 to FIG. 71, when the value R (Hk/4pMs) is smaller than 1.4, medium noise cannot be improved (reduced) even if the film thickness is reduced. This is because if R is below 1.4, the perpendicular orientation characteristic is insufficient and it is impossible to sufficiently suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

On the other hand, if the film satisfies the relationship that R is equal to or greater than 1.4, the medium noise is reduced up to the film thickness 50 [nm] for all the film types. As has been described above, if a film satisfies the relationship that R is equal to or greater than 1.4, it is possible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. However, even if the film satisfies the aforementioned relationship, the medium noise reduction cannot be seen when the film thickness exceeds 50 [nm]. This is because of the fact that if the film thickness is too great, the orientation perpendicular to the film surface is deteriorated and it is impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the recording medium DDDD3 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the DDDD3 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region. Moreover, when the Co₇₆Cr₂₀Ta₂PrSr film is provided under or both under and over the perpendicular magnetization film, similar results can be obtained because of the aforementioned reasons. Furthermore, film types other than the Co₇₆Cr₂₀Ta₂PrSr film can also have similar results if the relationship that R is equal to or more than 1.4 is satisfied.

Moreover, experiment was performed using the ID/MR composite head used in Example 1, instead of the mono-pole/MR composite head. The experiment showed results similar to the aforementioned results.

EXAMPLE 9

Media of Example 9 were prepared in the same way as in Example 5 except for that the FeSiAl target for sputtering was replaced by FeTaN target.

The medium having the Co₇₆Cr₂₀Pt₂TaLa film of 50 [nm] will be referred to as EEEE2 of the present invention. On the other hand, the medium having only the Co₈₀Cr₁₇Ta₃ film on the FeTaN film without forming the Co₇₆Cr₂₀Pt₂TaLa film will be referred to as a conventional medium (comparative example) F1.

It should be noted we also prepared a medium having the Co₇₆Cr₂₀Pt₂TaLa film and the Co₈₀Cr₁₇Ta₃ film in the reversed order. That is, firstly, Co₇₆Cr₂₀Pt₂TaLa film was formed on the substrate, and then the Co₈₀Cr₁₇Ta₃ film was formed on the Co₇₆Cr₂₀Pt₂TaLa film.

FIG. 7 shows the perpendicular magnetic anisotropic energy Ku and saturation magnetization Ms of the Co₇₄Cr₂₂Pt₂TaLa film, the Co₇₅Cr₂₁Pt₂TaLa film, the Co₇₆Cr₂₀Pt₂TaLa film, the Co₇₇Cr₁₉Pt₂TaLa film, the Co₇₈Cr₁₈Pt₂TaLa film, and the Co₈₀Cr₁₇Ta₃ film.

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium EEEE2 of the present invention and the conventional medium F1. The check conditions and the head characteristics were set in the same way as Example 5.

FIG. 72 shows the medium noise dependency on the recording density for the EEEE2 of the present invention and the conventional medium F1. As is clear from FIG. 72, the conventional medium F1 shows a very high medium noise in the lower recording density, whereas in the medium EEEE2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium F1. This is because the medium EEEE2 of the present invention includes a film having a preferable perpendicular magnetic anisotropy on the perpendicular magnetization film of Co₈₀Cr₁₇Ta₃. Accordingly, in contrast to the conventional F1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

Note that the FeTaN film has no magnetic domain wall structure and the spike-shaped noise is not generated easily due to the magnetic domain wall movement.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 73 to FIG. 77. As is clear from FIG. 73 to FIG. 77, when the value R (Hk/4pMs) is smaller than 1.4, medium noise cannot be improved (reduced) even if the film thickness is reduced. This is because if R is below 1.4, the perpendicular orientation characteristic is insufficient and it is impossible to sufficiently suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

On the other hand, if the film satisfies the relationship that R is equal to or greater than 1.4, the medium noise is reduced up to the film thickness 50 [nm] for all the film types. As has been described above, if a film satisfies the relationship that R is equal to or greater than 1.4, it is possible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

However, even if the film satisfies the aforementioned relationship, the medium noise reduction cannot be seen when the film thickness exceeds 50 [nm]. This is because of the fact that if the film thickness is too great, the orientation perpendicular to the film surface is deteriorated and it is impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the recording medium EEEE2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the EEEE2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region. Moreover, when the Co₇₆Cr₂₀Pt₂TaLa film is provided under or both under and over the perpendicular magnetization film, similar results can be obtained because of the aforementioned reasons. Furthermore, film types other than the Co₇₆Cr₂₀Pt₂TaLa film can also have similar results if the relationship that R is equal to or more than 1.4 is satisfied.

Moreover, in the experiment using the ID/MR composite head used in Example 1 instead of the mono-pole composite head, similar results were obtained because of the aforementioned reasons.

EXAMPLE 10-1

Media of Example 10-1 were prepared in the same way as in Example 9 except for that the Co_(x)Cr_(96−x)Pt₂TaLa (74≦×≦78) target was replaced by Co_(x)Cr_(96−x)Pt₂TaLu (74≦×≦78) target. The medium having the Co₇₆Cr₂₀Pt₂TaLu film of 50 [nm] will be referred to as FFFF2 of the present invention.

It should be noted we also prepared a medium having the Co₇₆Cr₂₀Pt₂TaLu film and the Co₈₀Cr₁₇Ta₃ film in the reversed order. That is, firstly, Co₇₆Cr₂₀Pt₂TaLu film was formed on the substrate, and then the Co₈₀Cr₁₇Ta₃ film was formed on the Co₇₆Cr₂₀Pt₂TaLu film.

FIG. 7 shows the perpendicular magnetic anisotropic energy Ku and saturation magnetization Ms of the Co₇₄Cr₂₂Pt₂TaLu film, the Co₇₅Cr₂₁Pt₂TaLu film, the Co₇₆Cr₂₀Pt₂TaLu film, the Co₇₇Cr₁₉Pt₂TaLu film, the Co₇₈Cr₁₈Pt₂TaLu film, and the Co₈₀Cr₁₇Ta₃ film.

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium FFFF2 of the present invention and the conventional medium F1. The check conditions and the head characteristics were set in the same way as Example 5.

FIG. 78 shows the medium noise dependency on the recording density for the FFFF2 of the present invention and the conventional medium F1. As is clear from FIG. 78, the conventional medium F1 shows a very high medium noise in the lower recording density, whereas in the medium FFFF2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium F1. This is because the medium FFFF2 of the present invention includes a film having a preferable perpendicular magnetic anisotropy on the perpendicular magnetization film of Co₈₀Cr₁₇Ta₃. Accordingly, in contrast to the conventional F1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

Note that the FeTaN film has no magnetic domain wall structure and the spike-shaped noise is not generated easily due to the magnetic domain wall movement.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 79 to FIG. 83. As is clear from FIG. 79 to FIG. 83, when the value R (Hk/4pMs) is smaller than 1.4, medium noise cannot be improved (reduced) even if the film thickness is reduced. This is because if R is below 1.4, the perpendicular orientation characteristic is insufficient and it is impossible to sufficiently suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

On the other hand, if the film satisfies the relationship that R is equal to or greater than 1.4, the medium noise is reduced up to the film thickness 50 [nm] for all the film types. As has been described above, if a film satisfies the relationship that R is equal to or greater than 1.4, it is possible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. However, even if the film satisfies the aforementioned relationship, the medium noise reduction cannot be seen when the film thickness exceeds 50 [nm]. This is because of the fact that if the film thickness is too great, the orientation perpendicular to the film surface is deteriorated and it is impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the recording medium FFFF2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the FFFF2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region. Moreover, when the Co₇₆Cr₂₀Pt₂TaLu film is provided under or both under and over the perpendicular magnetization film, similar results can be obtained because of the aforementioned reasons. Furthermore, film types other than the Co₇₆Cr₂₀Pt₂TaLu film can also have similar results if the relationship that R is equal to or more than 1.4 is satisfied.

Moreover, in the experiment using the ID/MR composite head used in Example 1 instead of the mono-pole composite head, similar results were obtained because of the aforementioned reasons.

EXAMPLE 10-2

Media of Example 10-1 were prepared in the same way as in Example 9 except for that the Co_(x)Cr_(96−x)Pt₂PrSr (74≦×≦78) target was replaced by Co_(x)Cr_(96−x)Pt₂PrSr (74≦×≦78) target. The medium having the Co₇₆Cr₂₀Pt₂PrSr film of 50 [nm] will be referred to as FFFF3 of the present invention.

It should be noted we also prepared a medium having the Co₇₆Cr₂₀Pt₂PrSr film and the Co₈₀Cr₁₇Ta₃ film in the reversed order. That is, firstly, Co₇₆Cr₂₀Pt₂PrSr film was formed on the substrate, and then the Co₈₀Cr₁₇Ta₃ film was formed on the Co₇₆Cr₂₀Pt₂PrSr film.

FIG. 35 and FIG. 7 shows the perpendicular magnetic anisotropic energy Ku and saturation magnetization Ms of the Co₇₄Cr₂₂Pt₂PrSr film, the Co₇₅Cr₂₁Pt₂PrSr film, the Co₇₆Cr₂₀Pt₂PrSr film, the Co₇₇Cr₁₉Pt₂PrSr film, the Co₇₈Cr₁₈Pt₂PrSr film, and the Co₈₀Cr₁₇Ta₃ film.

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium FFFF3 of the present invention and the conventional medium F1. The check conditions and the head characteristics were set in the same way as Example 5.

FIG. 84 shows the medium noise dependency on the recording density for the FFFF3 of the present invention and the conventional medium F1. As is clear from FIG. 84, the conventional medium F1 shows a very high medium noise in the lower recording density, whereas in the medium FFFF3 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium F1. This is because the medium FFFF3 of the present invention includes a film having a preferable perpendicular magnetic anisotropy on the perpendicular magnetization film of Co₈₀Cr₁₇Ta₃. Accordingly, in contrast to the conventional F1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

Note that the FeTaN film has no magnetic domain wall structure and the spike-shaped noise is not generated easily due to the magnetic domain wall movement.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 85 to FIG. 89. As is clear from FIG. 85 to FIG. 89, when the value R (Hk/4pMs) is smaller than 1.4, medium noise cannot be improved (reduced) even if the film thickness is reduced. This is because if R is below 1.4, the perpendicular orientation characteristic is insufficient and it is impossible to sufficiently suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

On the other hand, if the film satisfies the relationship that R is equal to or greater than 1.4, the medium noise is reduced up to the film thickness 50 [nm] for all the film types. As has been described above, if a film satisfies the relationship that R is equal to or greater than 1.4, it is possible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. However, even if the film satisfies the aforementioned relationship, the medium noise reduction cannot be seen when the film thickness exceeds 50 [nm]. This is because of the fact that if the film thickness is too great, the orientation perpendicular to the film surface is deteriorated and it is impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the recording medium FFFF3 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the FFFF3 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region. Moreover, when the Co₇₆Cr₂₀Pt₂PrSr film is provided under or both under and over the perpendicular magnetization film, similar results can be obtained because of the aforementioned reasons. Furthermore, film types other than the Co₇₆Cr₂₀Pt₂TaLu film can also have similar results if the relationship that R is equal to or more than 1.4 is satisfied.

Moreover, in the experiment using the ID/MR composite head used in Example 1 instead of the mono-pole composite head, similar results were obtained because of the aforementioned reasons.

EXAMPLE 11

By using a 6-inch target of Co₇₈Cr₁₉Ta₃ (%) for sputtering, 100 [nm] Co₇₈Cr₁₉Ta₃ was formed on a substrate at temperature of 400 degrees centigrade. The film formation conditions were set as follows: initial vacuum degree 5×10⁻⁷ [mTorr], electric power 0.5 [kW], argon gas pressure 4 [mTorr], and film formation speed 3 [nm/sed].

On this film, an YCo₅ film was formed by using an YCo₅ target, while gradually changing the film thickness from 5 to 55 [nm]. Furthermore, on this YCo₅ film, a C protection film was formed to have thickness of 10 [nm].

The medium having the YCo₅ of 50 [nm] will be referred to as A2 of the present invention. On the contrary, the conventional medium having only the Co₇₈Cr₁₉Ta₃ and no YCo₅ will be referred to as a conventional medium A1.

It should be noted that we also prepared a medium having the YCo₅ film and the Co₇₈Cr₁₉Ta₃ (at %) formed in the reversed order. That is, the YCo₅ film was first formed on the substrate and the Co₇₈Cr₁₉Ta₃ (at %) film was formed thereon.

The perpendicular magnetic anisotropic energy Ku of the YCo₅ film and the Co₇₈Cr₁₉Ta₃ (at %) film were measured using a torque magnetometer. The results are shown in FIG. 90 and FIG. 7. As shown in FIG. 90 and FIG. 7, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ (at %) film is 9.0×10⁵, whereas the perpendicular magnetic anisotropic energy Ku of the YCo₅ film is 5.0×10⁷, i.e., by far greater than the Co₇₈Cr₁₉Ta₃ (at %) film.

An ID/MR composite head was used to check the recording/reproduction characteristics of the medium A2 of the present invention and the conventional medium A1. The recording/reproduction conditions and the head used were same as the Example 1.

FIG. 91 shows medium noise dependency on the recording density for the medium A2 of the present invention and the conventional medium A1. As is clear from this FIG. 91, the conventional medium A1 has a very high noise in a lower recording density, whereas the medium A2 of the present invention has a suppressed noise in this low recording density region. This is because the medium A2 of the present invention has the perpendicular magnetic anisotropic energy Ku much higher than the Co₇₈Cr₁₉Ta₃ (at %) and has the film having a preferable magnetic anisotropy on the perpendicular magnetization film of Co₇₈Cr₁₉Ta₃ (at %). Accordingly, it is possible to effectively suppress generation of a reversed magnetic domain which may be caused in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness provided on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] so as to check the medium noise values at the recording density 10 [kFRPI]. The check results are shown in FIG. 92. As is clear from FIG. 92, no output lowering can be seen up to the YCo₅ film thickness of 50 [nm], but when the film thickness exceeds 50 [nm], there is no improvement (reduction) of the medium noise. This is because, if the YCo₅ film thickness becomes too great, the YCo₅ film orientation in the perpendicular direction is deteriorated, reducing the perpendicular magnetic anisotropic energy Ku. Accordingly it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the medium A2 of the present invention has an excellent medium noise characteristic even in a low recording density region. That is, by using the medium A2 of the present invention, it is possible to suppress the medium noise increase in the low recording density region which has been the problem of the conventional perpendicular magnetic recording medium.

Moreover, similar results can be obtained when the YCo₅ film is provided under the perpendicular magnetization film or both under and over the perpendicular magnetization film.

EXAMPLE 12

Media of Example 12 were prepared in the same way as Example 11, except for that a CeCo₅ target was used instead of the YCo₅ target.

The medium having the CeCo₅ of 50 [nm] will be referred to as B2 of the present invention.

Note that we also prepared media having CeC5 film and the Co₇₈Cr₁₉Ta₃ film formed in the reversed order, i.e., was firstly formed on the substrate, and then the Co₇₈Cr₁₉Ta₃ film was formed thereon.

The perpendicular magnetic anisotropic energy Ku of the CeCo₅ film and the Co₇₈Cr₁₉Ta₃ (at %) film were measured using a torque magnetometer. The results are shown in FIG. 90 and FIG. 7. As shown in FIG. 90 and FIG. 7, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ (at %) film is 9.0×10⁵, whereas the perpendicular magnetic anisotropic energy Ku of the CeCo₅ film is 6.0×10⁷ [erg/cc] i.e., by far greater than the Co₇₈Cr₁₉Ta₃ (at %) film.

An ID/MR composite head was used to check the recording/reproduction characteristics of the medium B2 of the present invention and the conventional medium A1. The recording/reproduction conditions and the head used were same as the Example 11.

FIG. 93 shows medium noise dependency on the recording density for the medium B2 of the present invention and the conventional medium A1. As is clear from this FIG. 93, the conventional medium A1 has a very high noise in a lower recording density, whereas the medium B2 of the present invention has a suppressed noise in this low recording density region. This is because the medium B2 of the present invention has the perpendicular magnetic anisotropic energy Ku much higher than the Co₇₈Cr₁₉Ta₃ (at %) and has the film having a preferable magnetic anisotropy on the perpendicular magnetization film of Co₇₈Cr₁₉Ta₃ (at %) Accordingly, it is possible to effectively suppress generation of a reversed magnetic domain which may be caused in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness provided on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] so as to check the medium noise values at the recording density 10 [kFRPI]. The check results are shown in FIG. 94. As is clear from FIG. 94, no output lowering can be seen up to the CeCo₅ film thickness of 50 [nm], but when the film thickness exceeds 50 [nm], there is no improvement (reduction) of the medium noise. This is because, if the CeCo₅ film thickness becomes too great, the CeCo₅ film orientation in the perpendicular direction is deteriorated, reducing the perpendicular magnetic anisotropic energy Ku. Accordingly it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the medium B2 of the present invention has an excellent medium noise characteristic even in a low recording density region. That is, by using the medium B2 of the present invention, it is possible to suppress the medium noise increase in the low recording density region which has been the problem of the conventional perpendicular magnetic recording medium.

Moreover, similar results can be obtained when the CeCo₅ film is provided under the perpendicular magnetization film or both under and over the perpendicular magnetization film.

EXAMPLE 13

Media of Example 13 were prepared in the same way as Example 11, except for that a SmCo₅Ti target was used instead of the YCo₅ target.

The medium having the SmCo₅Ti of 50 [nm] will be referred to as C2 of the present invention.

Note that we also prepared media having SmCo₅Ti film and the Co₇₈Cr₁₉Ta₃ film formed in the reversed order, i.e., the SmCo₅Ti film was formed firstly and then the Co₇₈Cr₁₉Ta₃ film was formed thereon.

The perpendicular magnetic anisotropic energy Ku of the SmCo₅Ti film and the Co₇₈Cr₁₉Ta₃ (at %) film were measured using a torque magnetometer. The results are shown in FIG. 90 and FIG. 7. As shown in FIG. 90 and FIG. 7, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ (at %) film is 9.0×10⁵, whereas the perpendicular magnetic anisotropic energy Ku of the SmCo₅Ti film is 1.0×10⁸ [erg/cc] i.e., which is by far greater than the Co₇₈Cr₁₉Ta₃ (at %) film.

An ID/MR composite head was used to check the recording/reproduction characteristics of the medium C2 of the present invention and the conventional medium A1. The recording/reproduction conditions and the head used were same as the Example 11.

FIG. 95 shows medium noise dependency on the recording density for the medium C2 of the present invention and the conventional medium A1. As is clear from this FIG. 95, the conventional medium A1 has a very high noise in a lower recording density region, whereas the medium C2 of the present invention has a suppressed noise in this low recording density region. This is because the medium C2 of the present invention has the perpendicular magnetic anisotropic energy Ku much higher than the Co₇₈Cr₁₉Ta₃ (at %) and has the film having a preferable magnetic anisotropy on the perpendicular magnetization film of Co₇₈Cr₁₉Ta₃ (at %). Accordingly, it is possible to effectively suppress generation of a reversed magnetic domain which may be caused in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness provided on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] so as to check the medium noise values at the recording density 10 [kFRPI]. The check results are shown in FIG. 96. As is clear from FIG. 96, no output lowering can be seen up to the SmCo₅Ti film thickness of 50 [nm], but when the film thickness exceeds 50 [nm], there is no improvement (reduction) of the medium noise. This is because, if the SmCo₅Ti film thickness becomes too great, the SmCo₅Ti film orientation in the perpendicular direction is deteriorated, reducing the perpendicular magnetic anisotropic energy Ku. Accordingly it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the medium C2 of the present invention has an excellent medium noise characteristic even in a low recording density region. That is, by using the medium C2 of the present invention, it is possible to suppress the medium noise increase in the low recording density region which has been the problem of the conventional perpendicular magnetic recording medium.

Moreover, similar results can be obtained when the SmCo₅ film is provided under the perpendicular magnetization film or both under and over the perpendicular magnetization film.

EXAMPLE 14

Media of Example 14 were prepared in the same way as Example 11, except for that a LaCo₅ target was used instead of the YCo₅ target.

The medium having the LaCo₅ of 50 [nm] will be referred to as D2 of the present invention.

Note that we also prepared media having LaCo₅ film and the Co₇₈Cr₁₉Ta₃ film formed in the reversed order, i.e., the LaCo₅ film was formed firstly and then the Co₇₈Cr₁₉Ta₃ film was formed thereon.

The perpendicular magnetic anisotropic energy Ku of the LaCo₅ film and the Co₇₈Cr₁₉Ta₃ (at %) film were measured using a torque magnetometer. The results are shown in FIG. 90 and FIG. 7. As shown in FIG. 90 and FIG. 7, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ (at %) film is 9.0×10⁵ [erg/cc] whereas the perpendicular magnetic anisotropic energy Ku of the LaCo₅ film is 6.0×10⁷ [erg/cc] i.e., which is by far greater than the Co₇₈Cr₁₉Ta₃ (at %) film.

An ID/MR composite head was used to check the recording/reproduction characteristics of the medium D2 of the present invention and the conventional medium A1. The recording/reproduction conditions and the head used were same as the Example 11.

FIG. 97 shows medium noise dependency on the recording density for the medium D2 of the present invention and the conventional medium A1. As is clear from this FIG. 97, the conventional medium A1 has a very high noise in a lower recording density region, whereas the medium D2 of the present invention has a suppressed noise in this low recording density region. This is because the medium D2 of the present invention has the perpendicular magnetic anisotropic energy Ku much higher than the Co₇₈Cr₁₉Ta₃ (at %) and has the film having a preferable magnetic anisotropy on the perpendicular magnetization film of Co₇₈Cr₁₉Ta₃ (at %). Accordingly, it is possible to effectively suppress generation of a reversed magnetic domain which may be caused in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness provided on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] so as to check the medium noise values at the recording density 10 [kFRPI]. The check results are shown in FIG. 98. As is clear from FIG. 98, no output lowering can be seen up to the LaCo₅ film thickness of 50 [nm], but when the film thickness exceeds 50 [nm], there is no improvement (reduction) of the medium noise. This is because, if the LaCo₅ film thickness becomes too great, the LaCo₅ film orientation in the perpendicular direction is deteriorated, reducing the perpendicular magnetic anisotropic energy Ku. Accordingly it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the medium D2 of the present invention has an excellent medium noise characteristic even in a low recording density region. That is, by using the medium D2 of the present invention, it is possible to suppress the medium noise increase in the low recording density region which has been the problem of the conventional perpendicular magnetic recording medium.

Moreover, similar results can be obtained when the LaCo₅ film is provided under the perpendicular magnetization film or both under and over the perpendicular magnetization film.

EXAMPLE 15

Media of Example 15 were prepared in the same way as Example 11, except for that a PrCo₅ target was used instead of the YCo₅ target.

The medium having the PrCo₅ of 50 [nm] will be referred to as E2 of the present invention.

Note that we also prepared media having PrCo₅ film and the Co₇₈Cr₁₉Ta₃ (at %) film formed in the reversed order, i.e., the PrCo₅ film was formed firstly and then the Co₇₈Cr₁₉Ta₃ film was formed thereon.

The perpendicular magnetic anisotropic energy Ku of the PrCo₅ film and the Co₇₈Cr₁₉Ta₃ (at %) film were measured using a torque magnetometer. The results are shown in FIG. 90 and FIG. 7. As shown in FIG. 90 and FIG. 7, the perpendicular magnetic anisotropic energy Ku of the CO₇₈Cr₁₉Ta₃ (at %) film is 9.0×10⁵ [erg/cc] whereas the perpendicular magnetic anisotropic energy Ku of the PrCo₅ film is 8.0×10⁷ [erg/cc] i.e., which is by far greater than the Co₇₈Cr₁₉Ta₃ (at %) film.

An ID/MR composite head was used to check the recording/reproduction characteristics of the medium E2 of the present invention and the conventional medium A1. The recording/reproduction conditions and the head used were identical to those of the Example 11.

FIG. 99 shows medium noise dependency on the recording density for the medium E2 of the present invention and the conventional medium A1. As is clear from this FIG. 99, the conventional medium A1 has a very high noise in a lower recording density region, whereas the medium E2 of the present invention has a suppressed noise in this low recording density region. This is because the medium E2 of the present invention has the perpendicular magnetic anisotropic energy Ku much higher than the Co₇₈Cr₁₉Ta₃ (at %) and has the film having a preferable magnetic anisotropy on the perpendicular magnetization film of Co₇₈Cr₁₉Ta₃ (at %). Accordingly, it is possible to effectively suppress generation of a reversed magnetic domain which may be caused in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness provided on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] so as to check the medium noise values at the recording density 10 [kFRPI]. The check results are shown in FIG. 100. As is clear from FIG. 100, no output lowering can be seen up to 50 [nm] thickness of the PrCo₅, but when the film thickness exceeds 50 [nm] there is no improvement (reduction) of the medium noise. This is because, if the PrCo₅ film thickness becomes too great, the PrCo₅ film orientation in the perpendicular direction is deteriorated, reducing the perpendicular magnetic anisotropic energy Ku. Accordingly it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the medium E2 of the present invention has an excellent medium noise characteristic even in a low recording density region. That is, by using the medium E2 of the present invention, it is possible to suppress the medium noise increase in the low recording density region which has been the problem of the conventional perpendicular magnetic recording medium.

Moreover, similar results can be obtained when the PrCo₅ film is provided under the perpendicular magnetization film or both under and over the perpendicular magnetization film.

EXAMPLE 16

Media of Example 16 were prepared in the same way as Example 11, except for that a Y₂Co₁₇ target was used instead of the YCo₅ target.

The medium having the Y₂Co₁₇ of 50 [nm] thickness will be referred to as F2 of the present invention.

Note that we also prepared media having Y₂Co₁₇ film and the Co₇₈Cr₁₉Ta₃ (at %) film formed in the reversed order, i.e., the Y₂Co₁₇ film was formed firstly and then the Co₇₈Cr₁₉Ta₃ film was formed thereon.

The perpendicular magnetic anisotropic energy Ku of the Y₂Co₁₇ film and the Co₇₈Cr₁₉Ta₃ (at %) film were measured using a torque magnetometer. The results are shown in FIG. 90 and FIG. 7. As shown in FIG. 90 and FIG. 7, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ (at %) film is 9.0×10⁵ [erg/cc] whereas the perpendicular magnetic anisotropic energy Ku of the Y₂Co₁₇ film is 2.0×10⁷ [erg/cc] i.e., which is by far greater than the Co₇₈Cr₁₉Ta₃ (at %) film.

An ID/MR composite head was used to check the recording/reproduction characteristics of the medium F2 of the present invention and the conventional medium A1. The recording/reproduction conditions and the head used were identical to those of the Example 11.

FIG. 101 shows medium noise dependency on the recording density for the medium F2 of the present invention and the conventional medium A1. As is clear from this FIG. 101, the conventional medium A1 has a very high noise in a lower recording density region, whereas the medium F2 of the present invention has a suppressed noise in this low recording density region. This is because the medium F2 of the present invention has the perpendicular magnetic anisotropic energy Ku much higher than the Co₇₈Cr₁₉Ta₃ (at %) and has the film having a preferable magnetic anisotropy on the perpendicular magnetization film of Co₇₈Cr₁₉Ta₃ (at %). Accordingly, it is possible to effectively suppress generation of a reversed magnetic domain which may be caused in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness provided on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] so as to check the medium noise values at the recording density 10 [kFRPI]. The check results are shown in FIG. 102. As is clear from FIG. 102, no output lowering can be seen up to 50 [nm] thickness of the Y₂Co₁₇, but when the film thickness exceeds 50 [nm], there is no improvement (reduction) of the medium noise. This is because, if the Y₂Co₁₇ film thickness becomes too great, the Y₂Co₁₇ film orientation in the perpendicular direction is deteriorated, reducing the perpendicular magnetic anisotropic energy Ku. Accordingly it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the medium F2 of the present invention has an excellent medium noise characteristic even in a low recording density region. That is, by using the medium F2 of the present invention, it is possible to suppress the medium noise increase in the low recording density region which has been the problem of the conventional perpendicular magnetic recording medium.

Moreover, similar results can be obtained when the Y₂Co₁₇ film is provided under the perpendicular magnetization film or both under and over the perpendicular magnetization film.

EXAMPLE 17

Media of Example 17 were prepared in the same way as Example 16, except for that a Ce₂Co₁₇ target was used instead of the Y₂Co₁₇ target.

The medium having the Ce₂Co₁₇ of 50 [nm] thickness will be referred to as G2 of the present invention.

Note that we also prepared media having Y₂Co₁₇ film and the Co₇₈Cr₁₉Ta₃ (at %) film formed in the reversed order, i.e., the Y₂Co₁₇ film was formed firstly and then the Co₇₈Cr₁₉Ta₃ (at %) film was formed thereon.

The perpendicular magnetic anisotropic energy Ku of the Ce₂Co₁₇ film and the Co₇₈Cr₁₉Ta₃ (at %) film were measured using a torque magnetometer. The results are shown in FIG. 90 and FIG. 7. As shown in FIG. 90 and FIG. 7, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ (at %) film is 9.0×10⁵ [erg/cc] whereas the perpendicular magnetic anisotropic energy Ku of the Ce₂Co₁₇ film is 3.0×10⁷ [erg/cc] i.e., which is by far greater than the Co₇₈Cr₁₉Ta₃ (at %) film.

An ID/MR composite head was used to check the recording/reproduction characteristics of the medium G2 of the present invention and the conventional medium A1. The recording/reproduction conditions and the head used were identical to those of the Example 11.

FIG. 103 shows medium noise dependency on the recording density for the medium G2 of the present invention and the conventional medium A1. As is clear from this FIG. 103, the conventional medium A1 has a very high noise in a lower recording density region, whereas the medium G2 of the present invention has a suppressed noise in this low recording density region. This is because the medium G2 of the present invention has the perpendicular magnetic anisotropic energy Ku much higher than the Co₇₈Cr₁₉Ta₃ (at %) and has the film having a preferable magnetic anisotropy on the perpendicular magnetization film of Co₇₈Cr₁₉Ta₃ (at %). Accordingly, it is possible to effectively suppress generation of a reversed magnetic domain which may be caused in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness provided on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] so as to check the medium noise values at the recording density 10 [kFRPI]. The check results are shown in FIG. 104. As is clear from FIG. 104, no output lowering can be seen up to 50 [nm] thickness of the Ce₂Co₁₇, but when the film thickness exceeds 50 [nm] there is no improvement (reduction) of the medium noise. This is because, if the Ce₂Co₁₇ film thickness becomes too great, the Ce₂Co₁₇ film orientation in the perpendicular direction is deteriorated, reducing the perpendicular magnetic anisotropic energy Ku. Accordingly it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the medium G2 of the present invention has an excellent medium noise characteristic even in a low recording density region. That is, by using the medium G2 of the present invention, it is possible to suppress the medium noise increase in the low recording density region which has been the problem of the conventional perpendicular magnetic recording medium.

Moreover, similar results can be obtained when the Ce₂Co₁₇ film is provided under the perpendicular magnetization film or both under and over the perpendicular magnetization film.

EXAMPLE 18

Media of Example 18 were prepared in the same way as Example 16, except for that a Sm₂Co₁₇Ti target was used instead of the Y₂Co₁₇ target.

The medium having the Sm₂Co₁₇Ti of 50 [nm] thickness will be referred to as H2 of the present invention.

Note that we also prepared media having Sm₂Co₁₇Ti film and the Co₇₈Cr₁₉Ta₃ (at %) film formed in the reversed order, i.e., the Sm₂Co₁₇Ti film was formed firstly and then the Co₇₈Cr₁₉Ta₃ (at %) film was formed thereon.

The perpendicular magnetic anisotropic energy Ku of the Sm₂Co₁₇Ti film and the Co₇₈Cr₁₉Ta₃ (at %) film were measured using a torque magnetometer. The results are shown in FIG. 90 and FIG. 7. As shown in FIG. 90 and FIG. 7, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ (at %) film is 9.0×10⁵ [erg/cc] whereas the perpendicular magnetic anisotropic energy Ku of the Sm₂Co₁₇Ti film is 4.2×10⁷ [erg/cc] i.e., which is by far greater than the Co₇₈Cr₁₉Ta₃ (at %) film.

An ID/MR composite head was used to check the recording/reproduction characteristics of the medium H2 of the present invention and the conventional medium A1. The recording/reproduction conditions and the head used were identical to those of the Example 11.

FIG. 105 shows medium noise dependency on the recording density for the medium H2 of the present invention and the conventional medium A1. As is clear from this FIG. 105, the conventional medium A1 has a very high noise in a lower recording density region, whereas the medium H2 of the present invention has a suppressed noise in this low recording density region. This is because the medium H2 of the present invention has the perpendicular magnetic anisotropic energy Ku much higher than the Co₇₈Cr₁₉Ta₃ (at %) and has the film having a preferable magnetic anisotropy on the perpendicular magnetization film of Co₇₈Cr₁₉Ta₃ (at %). Accordingly, it is possible to effectively suppress generation of a reversed magnetic domain which may be caused in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness provided on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] so as to check the medium noise values at the recording density 10 [kFRPI]. The check results are shown in FIG. 106. As is clear from FIG. 106, no output lowering can be seen up to 50 [nm] thickness of the Sm₂Co₁₇Ti, but when the film thickness exceeds 50 [nm], there is no improvement (reduction) of the medium noise. This is because, if the Sm₂Co₁₇Ti film thickness becomes too great, the Sm₂Co₁₇Ti film orientation in the perpendicular direction is deteriorated, reducing the perpendicular magnetic anisotropic energy Ku. Accordingly it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the medium H2 of the present invention has an excellent medium noise characteristic even in a low recording density region. That is, by using the medium H2 of the present invention, it is possible to suppress the medium noise increase in the low recording density region which has been the problem of the conventional perpendicular magnetic recording medium.

Moreover, similar results can be obtained when the Sm₂Co₁₇Ti film is provided under the perpendicular magnetization film or both under and over the perpendicular magnetization film.

EXAMPLE 19

Media of Example 19 were prepared in the same way as Example 16, except for that a La₂Co₁₇ target was used instead of the Y₂Co₁₇ target.

The medium having the La₂Co₁₇ of 50 [nm] thickness will be referred to as J2 of the present invention.

Note that we also prepared media having La₂Co₁₇ film and the Co₇₈Cr₁₉Ta₃ (at %) film formed in the reversed order, i.e., the La₂Co₁₇ film was formed firstly on the substrate and then the Co₇₈Cr₁₉Ta₃ (at %) film was formed thereon.

The perpendicular magnetic anisotropic energy Ku of the La₂Co₁₇ film and the Co₇₈Cr₁₉Ta₃ (at %) film were measured using a torque magnetometer. The results are shown in FIG. 90 and FIG. 7. As shown in FIG. 90 and FIG. 7, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ (at %) film is 9.0×10⁵ [erg/cc] whereas the perpendicular magnetic anisotropic energy Ku of the La₂Co₁₇ film is 3.5×10⁷ [erg/cc] i.e., which is by far greater than the Co₇₈Cr₁₉Ta₃ (at %) film.

An ID/MR composite head was used to check the recording/reproduction characteristics of the medium J2 of the present invention and the conventional medium A1. The recording/reproduction conditions and the head used were identical to those of the Example 11.

FIG. 107 shows medium noise dependency on the recording density for the medium J2 of the present invention and the conventional medium A1. As is clear from this FIG. 107, the conventional medium A1 has a very high noise in a lower recording density region, whereas the medium J2 of the present invention has a suppressed noise in this low recording density region. This is because the medium J2 of the present invention has the perpendicular magnetic anisotropic energy Ku much higher than the Co₇₈Cr₁₉Ta₃ (at %) and has the film having a preferable magnetic anisotropy on the perpendicular magnetization film of Co₇₈Cr₁₉Ta₃ (at %). Accordingly, it is possible to effectively suppress generation of a reversed magnetic domain which may be caused in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness provided on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] so as to check the medium noise values at the recording density 10 [kFRPI]. The check results are shown in FIG. 108. As is clear from FIG. 108, no output lowering can be seen up to 50 [nm] thickness of the La₂Co₁₇, but when the film thickness exceeds 50 [nm] there is no improvement (reduction) of the medium noise. This is because, if the La₂Co₁₇ film thickness becomes too great, the La₂Co₁₇ film orientation in the perpendicular direction is deteriorated, reducing the perpendicular magnetic anisotropic energy Ku. Accordingly it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the medium J2 of the present invention has an excellent medium noise characteristic even in a low recording density region. That is, by using the medium J2 of the present invention, it is possible to suppress the medium noise increase in the low recording density region which has been the problem of the conventional perpendicular magnetic recording medium.

Moreover, similar results can be obtained when the La₂Co₁₇ film is provided under the perpendicular magnetization film or both under and over the perpendicular magnetization film.

EXAMPLE 20

Media of Example 20 were prepared in the same way as Example 16, except for that a Pr₂Co₁₇ target was used instead of the Y₂Co₁₇ target.

The medium having the Pr₂Co₁₇ of 50 [nm] thickness will be referred to as K2 of the present invention.

Note that we also prepared media having Pr₂Co₁₇ film and the Co₇₈Cr₁₉Ta₃ (at %) film formed in the reversed order, i.e., the Pr₂Co₁₇ film was formed firstly on the substrate and then the Co₇₈Cr₁₉Ta₃ (at %) film was formed thereon.

The perpendicular magnetic anisotropic energy Ku of the La₂Co₁₇ film and the Co₇₈Cr₁₉Ta₃ (at %) film were measured using a torque magnetometer. The results are shown in FIG. 90 and FIG. 7. As shown in FIG. 90 and FIG. 7, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ (at %) film is 9.0×10⁵ [erg/cc] whereas the perpendicular magnetic anisotropic energy Ku of the Pr₂Co₁₇ film is 2.7×10⁷ [erg/cc] i.e., which is by far greater than the Co₇₈Cr₁₉Ta₃ (at %) film.

An ID/MR composite head was used to check the recording/reproduction characteristics of the medium K2 of the present invention and the conventional medium A1. The recording/reproduction conditions and the head used were identical to those of the Example 11.

FIG. 109 shows medium noise dependency on the recording density for the medium K2 of the present invention and the conventional medium A1. As is clear from this FIG. 109, the conventional medium A1 has a very high noise in a lower recording density region, whereas the medium K2 of the present invention has a suppressed noise in this low recording density region. This is because the medium K2 of the present invention has the perpendicular magnetic anisotropic energy Ku much higher than the Co₇₈Cr₁₉Ta₃ (at %) and has the film having a preferable magnetic anisotropy on the perpendicular magnetization film of Co₇₈Cr₁₉Ta₃ (at %). Accordingly, it is possible to effectively suppress generation of a reversed magnetic domain which may be caused in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness provided on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] so as to check the medium noise values at the recording density 10 [kFRPI]. The check results are shown in FIG. 110. As is clear from FIG. 110, no output lowering can be seen up to 50 [nm] thickness of the Pr₂Co₁₇₁ but when the film thickness exceeds 50 [nm], there is no improvement (reduction) of the medium noise. This is because, if the Pr₂Co₁₇ film thickness becomes too great, the Pr₂Co₁₇ film orientation in the perpendicular direction is deteriorated, reducing the perpendicular magnetic anisotropic energy Ku. Accordingly it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the medium K2 of the present invention has an excellent medium noise characteristic even in a low recording density region. That is, by using the medium K2 of the present invention, it is possible to suppress the medium noise increase in the low recording density region which has been the problem of the conventional perpendicular magnetic recording medium.

Moreover, similar results can be obtained when the Pr₂Co₁₇ film is provided under the perpendicular magnetization film or both under and over the perpendicular magnetization film.

EXAMPLE 21

Media of Example 21 were prepared in the same way as Example 11, except for that the YCo₅ target was replaced by a Ba ferrite, i.e., a BaFe₁₂O₁₉ target.

The medium having the BaFe₁₂O₁₉ of 50 [nm] thickness will be referred to as L2 of the present invention.

Note that we also prepared media having BaFe₁₂O₁₉ film and the Co₇₈Cr₁₉Ta₃ (at %) film formed in the reversed order, i.e., the BaFe₁₂O₁₉ film was formed firstly on the substrate and then the Co₇₈Cr₁₉Ta₃ (at %) film was formed thereon.

The perpendicular magnetic anisotropic energy Ku of the BaFe₁₂O₁₉ film and the Co₇₈Cr₁₉Ta₃ (at %) film were measured using a torque magnetometer. The results are shown in FIG. 111 and FIG. 7. As shown in FIG. 111 and FIG. 7, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ (at %) film is 9.0×10⁵ [erg/cc] whereas the perpendicular magnetic anisotropic energy Ku of the BaFe₁₂O₁₉ film is 3.3×10⁶ [erg/cc] i.e., which is by far greater than the Ku value of the Co₇₈Cr₁₉Ta₃ (at %) film.

An ID/MR composite head was used to check the recording/reproduction characteristics of the medium L2 of the present invention and the conventional medium A1. The recording/reproduction conditions and the head used were identical to those of the Example 11.

FIG. 112 shows medium noise dependency on the recording density for the medium L2 of the present invention and the conventional medium A1. As is clear from this FIG. 112, the conventional medium A1 has a very high noise in a lower recording density region, whereas the medium L2 of the present invention has a suppressed noise in this low recording density region. This is because the medium L2 of the present invention has the perpendicular magnetic anisotropic energy Ku much higher than the Co₇₈Cr₁₉Ta₃ (at %) and has the film having a preferable magnetic anisotropy on the perpendicular magnetization film of Co₇₈Cr₁₉Ta₃ (at %). Accordingly, it is possible to effectively suppress generation of a reversed magnetic domain which may be caused in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness provided on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] so as to check the medium noise values at the recording density 10 [kFRPI]. The check results are shown in FIG. 113. As is clear from FIG. 113, no output lowering can be seen up to 50 [nm] thickness of the BaFe₁₂O₁₉, but when the film thickness exceeds 50 [nm], there is no improvement (reduction) of the medium noise. This is because, if the BaFe₁₂O₁₉ film thickness becomes too great, the BaFe₁₂O₁₉ film orientation in the perpendicular direction is deteriorated, reducing the perpendicular magnetic anisotropic energy Ku. Accordingly it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the medium L2 of the present invention has an excellent medium noise characteristic even in a low recording density region. That is, by using the medium L2 of the present invention, it is possible to suppress the medium noise increase in the low recording density region which has been the problem of the conventional perpendicular magnetic recording medium.

Moreover, similar results can be obtained when the BaFe₁₂O₁₉ film is provided under the perpendicular magnetization film or both under and over the perpendicular magnetization film.

EXAMPLE 22

Media of Example 22 were prepared in the same way as Example 11, by using another Ba ferrite, i.e., a BaFe₁₈O₂₇ target instead of the BaFe₁₂O₁₉ target used in Example 21.

The medium having the BaFe₁₈O₂₇ of 50 [nm] thickness will be referred to as M2 of the present invention.

Note that we also prepared media having BaFe₁₈O₂₇ film and the Co₇₈Cr₁₉Ta₃ (at %) film formed in the reversed order, i.e., the BaFe₁₈O₂₇ film was formed firstly on the substrate and then the Co₇₈Cr₁₉Ta₃ (at %) film was formed thereon.

The perpendicular magnetic anisotropic energy Ku of the BaFe₁₈O₂₇ film and the Co₇₈Cr₁₉Ta₃ (at %) film were measured using a torque magnetometer. The results are shown in FIG. 111 and FIG. 7. As shown in FIG. 111 and FIG. 7, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ (at %) film is 9.0×10⁵ [erg/cc] whereas the vertical magnetic anisotropic energy Ku of the BaFe₁₈O₂₇ film is 3.0×10⁶ [erg/cc] i.e., which is by far greater than the Ku value of the CO₂₈Cr₁₉Ta₃ (at %) film.

An ID/MR composite head was used to check the recording/reproduction characteristics of the medium M2 of the present invention and the conventional medium A1. The recording/reproduction conditions and the head used were identical to those of the Example 11.

FIG. 114 shows medium noise dependency on the recording density for the medium M2 of the present invention and the conventional medium A1. As is clear from this FIG. 114, the conventional medium A1 has a very high noise in a lower recording density region, whereas the medium M2 of the present invention has a suppressed noise in this low recording density region. This is because the medium M2 of the present invention has the perpendicular magnetic anisotropic energy Ku much higher than the Co₇₈Cr₁₉Ta₃ (at %) and has the film having a preferable magnetic anisotropy on the perpendicular magnetization film of Co₇₈Cr₁₉Ta₃ (at %). Accordingly, it is possible to effectively suppress generation of a reversed magnetic domain which may be caused in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness provided on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] so as to check the medium noise values at the recording density 10 [kFRPI]. The check results are shown in FIG. 115. As is clear from FIG. 115, no output lowering can be seen up to 50 [nm] thickness of the BaFe₁₈Co₂₇, but when the film thickness exceeds 50 [nm], there is no improvement (reduction) of the medium noise. This is because, if the BaFe₁₈O₂₇ film thickness becomes too great, the BaFe₁₈O₂₇ film orientation in the perpendicular direction is deteriorated, reducing the perpendicular magnetic anisotropic energy Ku. Accordingly it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the medium M2 of the present invention has an excellent medium noise characteristic even in a low recording density region. That is, by using the medium M2 of the present invention, it is possible to suppress the medium noise increase in the low recording density region which has been the problem of the conventional perpendicular magnetic recording medium.

Moreover, similar results can be obtained when the BaFe₁₈O₂₇ film is provided under the perpendicular magnetization film or both under and over the perpendicular magnetization film.

EXAMPLE 23

Media of Example 23 were prepared in the same way as Example 11, using a Sr ferrite target, i.e., a SrFe₁₂O₁₉ target in stead of the BaFe₁₂O₁₉ target used in Example 21. The medium having the SrFe₁₂O₁₉ of 50 [nm] thickness will be referred to as N2 of the present invention.

Note that we also prepared media having SrFe₁₂O₁₉ film and the Co₇₈Cr₁₉Ta₃ (at %) film formed in the reversed order, i.e., the BaFe₁₂O₁₉ film was formed firstly on the substrate and then the Co₇₈Cr₁₉Ta₃ (at %) film was formed thereon.

The perpendicular magnetic anisotropic energy Ku of the SrFe₁₂O₁₉ film and the Co₇₈Cr₁₉Ta₃ (at %) film were measured using a torque magnetometer. The results are shown in FIG. 111 and FIG. 7. As shown in FIG. 111 and FIG. 7, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ (at %) film is 9.0×10⁵ [erg/cc] whereas the vertica magnetic anisotropic energy Ku of the SrFe₁₂O₁₉ film is 3.4×10⁶ [erg/cc] i.e., which is by far greater than the Ku value of the Co₇₈Cr₁₉Ta₃ (at %) film.

An ID/MR composite head was used to check the recording/reproduction characteristics of the medium N2 of the present invention and the conventional medium A1. The recording/reproduction conditions and the head used were identical to those of the Example 11.

FIG. 116 shows medium noise dependency on the recording density for the medium N2 of the present invention and the conventional medium A1. As is clear from this FIG. 116, the conventional medium A1 has a very high noise in a lower recording density region, whereas the medium N2 of the present invention has a suppressed noise in this low recording density region. This is because the medium N2 of the present invention has the perpendicular magnetic anisotropic energy Ku much higher than the Co₇₈Cr₁₉Ta₃ (at %) and has the film having a preferable magnetic anisotropy on the perpendicular magnetization film of Co₇₈Cr₁₉Ta₃ (at %). Accordingly, it is possible to effectively suppress generation of a reversed magnetic domain which may be caused in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness provided on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] so as to check the medium noise values at the recording density 10 [kFRPI]. The check results are shown in FIG. 117. As is clear from FIG. 117, no output lowering can be seen up to 50 [nm] thickness of the SrFe₁₂Co₁₉, but when the film thickness exceeds 50 [nm], there is no improvement (reduction) of the medium noise. This is because, if the SrFe₁₂O₁₉ film thickness becomes too great, the SrFe₁₂O₁₉ film orientation in the perpendicular direction is deteriorated, reducing the perpendicular magnetic anisotropic energy Ku. Accordingly it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the medium N2 of the present invention has an excellent medium noise characteristic even in a low recording density region. That is, by using the medium N2 of the present invention, it is possible to suppress the medium noise increase in the low recording density region which has been the problem of the conventional perpendicular magnetic recording medium.

Moreover, similar results can be obtained when the SrFe₁₂O₁₉ film is provided under the perpendicular magnetization film or both under and over the perpendicular magnetization film.

EXAMPLE 24

Media of Example 24 were prepared in the same way as Example 11, using another Sr ferrite target, i.e., a SrFe₁₈O₂₇, target instead of the SrFe₁₂O₁₉, target used in Example 23. The medium having the SrFe₁₈O₂₇of 50 [nm] thickness will be referred to as P2 of the present invention.

Note that we also prepared media having SrFe¹⁸O₂₇ film and the Co₇₈Cr₁₉Ta₃ (at %) film formed in the reversed order, i.e., the BaFe₁₈O₂₇, film was formed firstly on the substrate and then the Co₇₈Cr₁₉Ta₃ (at %) film was formed thereon.

The perpendicular magnetic anisotropic energy Ku of the SrFe₁₈O₂₇ film and the Co₇₈Cr₁₉Ta₃ (at %) film were measured using a torque magnetometer. The results are shown in FIG. 111 and FIG. 7. As shown in FIG. 111 and FIG. 7, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ (at %) film is 9.0×10⁵ [erg/cc] whereas the vertical magnetic anisotropic energy Ku of the SrFe₁₈O₂₇ film is 3.1×10⁶ [erg/cc] i.e., which is by far greater than the Ku value of the Co₇₈Cr₁₉Ta₃ (at %) film.

An ID/MR composite head was used to check the recording/reproduction characteristics of the medium P2 of the present invention and the conventional medium A1. The recording/reproduction conditions and the head used were identical to those of the Example 11.

FIG. 118 shows medium noise dependency on the recording density for the medium P2 of the present invention and the conventional medium A1. As is clear from this FIG. 118, the conventional medium A1 has a very high noise in a lower recording density region, whereas the medium P2 of the present invention has a suppressed noise in this low recording density region. This is because the medium P2 of the present invention has the perpendicular magnetic anisotropic energy Ku much higher than the Co₇₈Cr₁₉Ta₃ (at %) and has the film having a preferable magnetic anisotropy on the perpendicular magnetization film of Co₇₈Cr₁₉Ta₃ (at %). Accordingly, it is possible to effectively suppress generation of a reversed magnetic domain which may be caused in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness provided on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] so as to check the medium noise values at the recording density 10 [kFRPI]. The check results are shown in FIG. 119. As is clear from FIG. 119, no output lowering can be seen up to 50 [nm] thickness of the SrFe₁₈Co₂₇, but when the film thickness exceeds 50 [nm], there is no improvement (reduction) of the medium noise. This is because, if the SrFe₁₂O₁₉ film thickness becomes too great, the SrFe₁₂O₁₉ film orientation in the perpendicular direction is deteriorated, reducing the perpendicular magnetic anisotropic energy Ku. Accordingly it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the medium P2 of the present invention has an excellent medium noise characteristic even in a low recording density region. That is, by using the medium P2 of the present invention, it is possible to suppress the medium noise increase in the low recording density region which has been the problem of the conventional perpendicular magnetic recording medium.

Moreover, similar results can be obtained when the SrFe₁₈O₂₇ film is provided under the perpendicular magnetization film or both under and over the perpendicular magnetization film.

EXAMPLE 25

Media of Example 25 were prepared in the same way as Example 11 except for that the YCo₅ target was replaced Pt₅₀Co₅₀ (at %) target. The medium having the Pt₅₀Co₅₀ of 50 [nm] thickness will be referred to as Q2 of the present invention.

Note that we also prepared media having Pt₅₀Co₅₀ film and the Co₇₈Cr₁₉Ta₃ (at %) film formed in the reversed order, i.e., the Pt₅₀Co₅₀ film was formed firstly on the substrate and then the Co₇₈Cr₁₉Ta₃ (at %) film was formed thereon.

The perpendicular magnetic anisotropic energy Ku of the Pt₅₀Co₅₀ (at %) film and the Co₇₈Cr₁₉Ta3 (at %) film were measured using a torque magnetometer. The results are shown in FIG. 111 and FIG. 7. As shown in FIG. 111 and FIG. 7, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ (at %) film is 9.0×10⁵ [erg/cc] whereas the vertica magnetic anisotropic energy Ku of the Pt₅₀Co₅₀ film is 1.0×10⁷ [erg/cc] i.e., which is by far greater than the Ku value of the Co₇₈Cr₁₉Ta₃ (at %) film.

An ID/MR composite head was used to check the recording/reproduction characteristics of the medium Q2 of the present invention and the conventional medium A1. The recording/reproduction conditions and the head used were identical to those of the Example 11.

FIG. 120 shows medium noise dependency on the recording density for the medium Q2 of the present invention and the conventional medium A1. As is clear from this FIG. 120, the conventional medium A1 has a very high noise in a lower recording density region, whereas the medium Q2 of the present invention has a suppressed noise in this low recording density region. This is because the medium Q2 of the present invention has the perpendicular magnetic anisotropic energy Ku much higher than the Co₇₈Cr₁₉Ta₃ (at %) and has the film having a preferable magnetic anisotropy on the perpendicular magnetization film of Co₇₈Cr₁₉Ta₃ (at %). Accordingly, it is possible to effectively suppress generation of a reversed magnetic domain which may be caused in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness provided on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] so as to check the medium noise values at the recording density 10 [kFRPI]. The check results are shown in FIG. 121. As is clear from FIG. 121, no output lowering can be seen up to 50 [nm] thickness of the Pt₅₀Co₅₀, but when the film thickness exceeds 50 [nm] there is no improvement (reduction) of the medium noise. This is because, if the Pt₅₀Co₅₀ film thickness becomes too great, the Pt₅₀Co₅₀ film orientation in the perpendicular direction is deteriorated, reducing the perpendicular magnetic anisotropic energy Ku. Accordingly it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

As has been described above, the medium Q2 of the present invention has an excellent medium noise characteristic even in a low recording density region. That is, by using the medium Q2 of the present invention, it is possible to suppress the medium noise increase in the low recording density region which has been the problem of the conventional perpendicular magnetic recording medium.

Moreover, similar results can be obtained when the Pt₅₀Co₅₀ film is provided under the perpendicular magnetization film or both under and over the perpendicular magnetization film.

EXAMPLE 26

Using a 6-inch FeSiAl target for sputtering, a FeSiAl film was formed with a thickness of 500 [nm] on 2.5-inch substrates. The film formation conditions were as follows: initial vacuum degree 5×10⁻⁷ [mTorr]; electric power 0.5 [kw]; argon gas pressure 4 [mTorr]; film formation speed 3 [nm/sec].

Then, each of the FeSiAl films on the substrates at temperature of 400 degrees centigrade was covered by 100 [nm] of Co₇₈Cr₁₉Ta₃ (at %) film formed by using a Co₇₈Cr₁₉Ta₃ target under the same film formation conditions as FeSiAl.

Next, the Co₇₈Cr₁₉Ta₃ films were respectively covered by 10 to 55 [nm] thickness of YCo₅ films. Furthermore, a C (carbon) protection film of 10 [nm] was formed to cover each of the aforementioned films.

The medium having the 50 [nm] of YCo₅ will be referred to as AA2 of the present invention.

On the other hand, the medium having no YCo₅ film will be referred to as a conventional medium (comparative example) B1.

It should be noted we also prepared a medium having the YCO₅ film and the Co₇₈Cr₁₉Ta₃ film in the reversed order. That is, firstly, YCo₅ film was formed on the substrate, and then the Co₇₈Cr₁₉Ta₃ film was formed on the YCo₅ film.

As has been shown in Example 11, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ film is 9.0×10⁵ [erg/cc], whereas the perpendicular magnetic anisotropic energy of the YCo₅ film is 5.0×10⁷ [erg/cc], which is by far greater than the Ku of the Co₇₈Cr₁₉Ta₃ film. (See FIG. 90 and FIG. 7)

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium AA2 of the present invention and the conventional medium B1. The check conditions were set as follows: mono-pole head recording track width 4 [micrometers], the main magnetic pole film thickness 0.4 [micrometers], reproduction track width 3 [micrometers], and reproduction gap length 0.32 [micrometers]. Note that the check was performed under the condition of: recording current 10 [mAop], sense current 12 [mA], peripheral velocity 12.7 [m/s], and floating amount 45 [nm].

FIG. 122 shows the medium noise dependency on the recording density for the AA2 of the present invention and the conventional medium B1. As is clear from FIG. 122, the conventional medium B1 shows a very high medium noise in the lower recording density, whereas in the medium AA2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium E1. This is because the medium AA2 of the present invention includes the YCo₅ film having much higher perpendicular magnetic anisotropy Ku than the Co₇₈Cr₁₉Ta₃ and the film is formed on the Co₇₈Cr₁₉Ta₃ film Accordingly, in contrast to the conventional B1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. Note that the FeSiAl film has no magnetic domain wall structure and the spike-shaped noise is not generated easily due to the magnetic domain wall movement.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 123. As is clear from FIG. 123, no output lowering can be seen up to 50 [nm] of the YCo₅ film. When the YCo₅ film thickness exceeds 50 [nm], the medium noise cannot be improved (reduced). This is because if YCo₅ film thickness becomes too large, YCo₅ film orientation in the perpendicular direction to the film surface is deteriorated and the perpendicular magnetic anisotropic energy Ku becomes smaller. Thus, it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the perpendicular magnetization film.

As has been described above, the recording medium AA2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the AA2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region.

Moreover, when the YCo₅ film was provided under or both under and over the perpendicular magnetization film, similar results were obtained because of the aforementioned reasons.

Furthermore, in the experiment using the ID/MR composite head used in Example 1 instead of the mono-pole composite head, similar results were obtained because of the aforementioned reasons.

EXAMPLE 27

Media of Example 27 was prepared in the same way as Example 26, except for that the YCo₅ target for sputtering was replaced by a CeCo₅ target.

The medium having the CeCo₅ of 50 [nm] will be referred to as BB2 of the present invention.

It should be noted we also prepared a medium having the CeCo₅ film and the Co₇₈Cr₁₉Ta₃ film in the reversed order. That is, firstly, CeCo₅ film was formed on the FeSiAl film, and then the Co₇₈Cr₁₉Ta₃ film was formed on the CeCo₅ film.

As has been shown in Example 12, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ film is 9.0×10⁵ [erg/cc], whereas the perpendicular magnetic anisotropic energy of the CeCo₅ film is 6.0×10⁷ [erg/cc], which is by far greater than the Ku of the Co₇₈Cr₁₉Ta₃ film. (See FIG. 90 and FIG. 7)

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium BB2 of the present invention and the conventional medium B1. The check conditions were the same as in Example 26.

FIG. 124 shows the medium noise dependency on the recording density for the BB2 of the present invention and the conventional medium B1. As is clear from FIG. 124, the conventional medium B1 shows a very high medium noise in the lower recording density, whereas in the medium BB2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium B1. This is because the medium BB2 of the present invention includes the film having much higher perpendicular magnetic anisotropy Ku than the Co₇₈Cr₁₉Ta₃ and the film is formed on that Co₇₈Cr₁₉Ta₃ film. Accordingly, in contrast to the conventional B1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 125. As is clear from FIG. 125, no output lowering can be seen up to 50 [nm] of the CeCo₅ film. When the CeCo₅ film thickness exceeds 50 [nm], the medium noise cannot be improved (reduced). This is because if CeCo₅ film thickness becomes too large, YCo₅ film orientation in the perpendicular direction to the film surface is deteriorated and the perpendicular magnetic anisotropic energy Ku becomes smaller. Thus, it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the perpendicular magnetization film.

As has been described above, the recording medium BB2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the BB2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region.

Moreover, when the CeCo₅ film was provided under or both under and over the perpendicular magnetization film, similar results were obtained because of the aforementioned reasons.

Furthermore, in the experiment using the ID/MR composite head used in Example 1 instead of the mono-pole composite head, similar results were obtained because of the aforementioned reasons.

EXAMPLE 28

Media of Example 28 were prepared in the same way as Example 26, except for that the YCo₅ target for sputtering was replaced by a SmCo₅ target.

The medium having the SmCo₅ of 50 [nm] will be referred to as CC2 of the present invention.

It should be noted we also prepared a medium having the SmCo₅ film and the Co₇₈Cr₁₉Ta₃ (at %) film in the reversed order. That is, firstly, SmCo₅ film was formed on the FeSiAl film, and then the Co₇₈Cr₁₉Ta₃ film was formed on the SmCo₅ film.

As has been shown in Example 13, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ film is 9.0×10⁵ [erg/cc], whereas the perpendicular magnetic anisotropic energy of the SmCo₅ film is 1.0×10⁸ [erg/cc], which is by far greater than the Ku of the Co₇₈Cr₁₉Ta₃ film. (See FIG. 90 and FIG. 7)

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium CC2 of the present invention and the conventional medium B1. The check conditions were the same as in Example 26.

FIG. 126 shows the medium noise dependency on the recording density for the CC2 of the present invention and the conventional medium B1. As is clear from FIG. 126, the conventional medium B1 shows a very high medium noise in the lower recording density, whereas in the medium CC2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium B1. This is because the medium CC2 of the present invention includes the film having much higher perpendicular magnetic anisotropy Ku than the Co₇₈Cr₁₉Ta₃ and the film is formed on that Co₇₈Cr₁₉Ta₃ film. Accordingly, in contrast to the conventional B1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 127. As is clear from FIG. 127, no output lowering can be seen up to 50 [nm] of the SmCo₅ film. When the SmCo₅ film thickness exceeds 50 [nm], the medium noise cannot be improved (reduced). This is because if SmCo₅ film thickness becomes too large, YCo₅ film orientation in the perpendicular direction to the film surface is deteriorated and the perpendicular magnetic anisotropic energy Ku becomes smaller. Thus, it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the perpendicular magnetization film.

As has been described above, the recording medium CC2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the CC2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region.

Moreover, when the SmCo₅ film was provided under or both under and over the perpendicular magnetization film, similar results were obtained because of the aforementioned reasons.

Furthermore, in the experiment using the ID/MR composite head used in Example 1 instead of the mono-pole composite head, similar results were obtained because of the aforementioned reasons.

EXAMPLE 29

Media of Example 29 were prepared in the same way as Example 26, except for that the YCo₅ target for sputtering was replaced by a LaCo₅ target.

The medium having the LaCo₅ of 50 [nm] will be referred to as DD2 of the present invention.

It should be noted we also prepared a medium having the LaCo₅ film and the Co₇₈Cr₁₉Ta₃ (at %) film in the reversed order. That is, firstly, LaCo₅ film was formed on the FeSiAl film, and then the Co₇₈Cr₁₉Ta₃ film was formed on the LaCo₅ film.

As has been shown in Example 14, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ film is 9.0×10⁵ [erg/cc], whereas the perpendicular magnetic anisotropic energy of the LaCo₅ film is 6.0×10⁷ [erg/cc], which is by far greater than the Ku of the Co₇₈Cr₁₉Ta₃ film. (See FIG. 90 and FIG. 7)

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium DD2 of the present invention and the conventional medium B1. The check conditions were the same as in Example 26.

FIG. 128 shows the medium noise dependency on the recording density for the DD2 of the present invention and the conventional medium B1. As is clear from FIG. 128, the conventional medium B1 shows a very high medium noise in the lower recording density, whereas in the medium DD2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium B1. This is because the medium DD2 of the present invention includes the film having much higher perpendicular magnetic anisotropy Ku than the Co₇₈Cr₁₉Ta₃ and the film is formed on that Co₇₈Cr₁₉Ta₃ film. Accordingly, in contrast to the conventional B1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 129. As is clear from FIG. 129, no output lowering can be seen up to 50 [nm] of the LaCo₅ film. When the LaCo₅ film thickness exceeds 50 [nm], the medium noise cannot be improved (reduced). This is because if LaCo₅ film thickness becomes too large, LaCo₅ film orientation in the perpendicular direction to the film surface is deteriorated and the perpendicular magnetic anisotropic energy Ku becomes smaller. Thus, it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the perpendicular magnetization film.

As has been described above, the recording medium DD2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the DD2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region.

Moreover, when the LaCo₅ film was provided under or both under and over the perpendicular magnetization film, similar results were obtained because of the aforementioned reasons.

Furthermore, in the experiment using the ID/MR composite head used in Example 11 instead of the mono-pole composite head, similar results were obtained because of the aforementioned reasons.

EXAMPLE 30

Media of Example 30 were prepared in the same way as Example 26, except for that the YCo₅ target for sputtering was replaced by a PrCo₅ target.

The medium having the PrCo₅ of 50 [nm] will be referred to as EE2 of the present invention.

It should be noted we also prepared a medium having the PrCo₅ film and the Co₇₈Cr₁₉Ta₃ (at %) film in the reversed order. That is, firstly, PrCo₅ film was formed on the FeSiAl film, and then the Co₇₈Cr₁₉Ta₃ film was formed on the PrCo₅ film.

As has been shown in Example 15, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ film is 9.0×10⁵ [erg/cc], whereas the perpendicular magnetic anisotropic energy of the PrCo₅ film is 8.0×10⁷ [erg/cc], which is by far greater than the Ku of the Co₇₈Cr₁₉Ta₃ film. (See FIG. 90 and FIG. 7)

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium EE2 of the present invention and the conventional medium B1. The check conditions were the same as in Example 26.

FIG. 130 shows the medium noise dependency on the recording density for the EE2 of the present invention and the conventional medium B1. As is clear from FIG. 130, the conventional medium B1 shows a very high medium noise in the lower recording density, whereas in the medium EE2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium B1. This is because the medium EE2 of the present invention includes the film having much higher perpendicular magnetic anisotropy Ku than the Co₇₈Cr₁₉Ta₃ and the film is formed on the Co₇₈Cr₁₉Ta₃ film. Accordingly, in contrast to the conventional B1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 131. As is clear from FIG. 131, no output lowering can be seen up to 50 [nm] of the PrCo₅ film. When the PrCo₅ film thickness exceeds 50 [nm], the medium noise cannot be improved (reduced). This is because if PrCo₅ film thickness becomes too large, PrCo₅ film orientation in the perpendicular direction to the film surface is deteriorated and the perpendicular magnetic anisotropic energy Ku becomes smaller. Thus, it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the perpendicular magnetization film.

As has been described above, the recording medium EE2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the EE2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region.

Moreover, when the PrCo₅ film was provided under or both under and over the perpendicular magnetization film, similar results were obtained because of the aforementioned reasons.

Furthermore, in the experiment using the ID/MR composite head used in Example 11 instead of the mono-pole composite head, similar results were obtained because of the aforementioned reasons.

EXAMPLE 31

Media of Example 30 were prepared in the same way as Example 26, except for that the YCo₅ target for sputtering was replaced by a Y₂Co₁₇ target.

The medium having the Y₂Co₁₇ of 50 [nm] will be referred to as FF2 of the present invention.

It should be noted we also prepared a medium having the Y₂Co₁₇ film and the Co₇₈Cr₁₉Ta₃ (at %) film in the reversed order. That is, firstly, Y₂Co₁₇ film was formed on the FeSiAl film, and then the Co₇₈Cr₁₉Ta₃ film was formed on the Y₂Co₁₇ film.

As has been shown in Example 16, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ film is 9.0×10⁵ [erg/cc], whereas the perpendicular magnetic anisotropic energy of the Y₂Co₁₇ film is 2.0×10⁷ [erg/cc], which is by far greater than the Ku of the Co₇₈Cr₁₉Ta₃ film. (See FIG. 90 and FIG. 7)

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium FF2 of the present invention and the conventional medium B1. The check conditions were the same as in Example 26.

FIG. 132 shows the medium noise dependency on the recording density for the FF2 of the present invention and the conventional medium B1. As is clear from FIG. 132, the conventional medium B1 shows a very high medium noise in the lower recording density, whereas in the medium FF2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium B1. This is because the medium FF2 of the present invention includes the film having much higher perpendicular magnetic anisotropy Ku than the Co₇₈Cr₁₉Ta₃ and the film is formed on the Co₇₈Cr₁₉Ta₃ film. Accordingly, in contrast to the conventional B1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 133. As is clear from FIG. 133, no output lowering can be seen up to 50 [nm] of the Y₂Co₁₇ film. When the Y₂Co₁₇ film thickness exceeds 50 [nm], the medium noise cannot be improved (reduced). This is because if Y₂Co₁₇ film thickness becomes too large, Y₂Co₁₇ film orientation in the perpendicular direction to the film surface is deteriorated and the perpendicular magnetic anisotropic energy Ku becomes smaller. Thus, it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the perpendicular magnetization film.

As has been described above, the recording medium FF2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the FF2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region.

Moreover, when the Y₂Co₁₇ film was provided under or both under and over the perpendicular magnetization film, similar results were obtained because of the aforementioned reasons.

Furthermore, in the experiment using the ID/MR composite head used in Example 11 instead of the mono-pole composite head, similar results were obtained because of the aforementioned reasons.

EXAMPLE 32

Media of Example 32 were prepared in the same way as Example 26, except for that the YCo₅ target for sputtering was replaced by a Ce₂Co₁₇ target.

The medium having the Ce₂Co₁₇ of 50 [nm] will be referred to as GG2 of the present invention.

It should be noted we also prepared a medium having the Ce₂Co₁₇ film and the Co₇₈Cr₁₉Ta₃ (at %) film in the reversed order. That is, firstly, Ce₂Co₁₇ film was formed on the FeSiAl film, and then the Co₇₈Cr₁₉Ta₃ film was formed on the Ce₂Co₁₇ film.

As has been shown in Example 17, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ film is 9.0×10⁵ [erg/cc], whereas the perpendicular magnetic anisotropic energy of the Ce₂Co₁₇ film is 3.0×10⁷ [erg/cc], which is by far greater than the Ku of the Co₇₈Cr₁₉Ta₃ film. (See FIG. 90 and FIG. 7)

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium GG2 of the present invention and the conventional medium B1. The check conditions were the same as in Example 26.

FIG. 134 shows the medium noise dependency on the recording density for the GG2 of the present invention and the conventional medium B1. As is clear from FIG. 134, the conventional medium B1 shows a very high medium noise in the lower recording density, whereas in the medium GG2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium B1. This is because the medium GG2 of the present invention includes the film having much higher perpendicular magnetic anisotropy Ku than the Co₇₈Cr₁₉Ta₃ and the film is formed on the Co₇₈Cr₁₉Ta₃ film. Accordingly, in contrast to the conventional B1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 135. As is clear from FIG. 135, no output lowering can be seen up to 50 [nm] of the Ce₂Co₁₇ film. When the Ce₂Co₁₇ film thickness exceeds 50 [nm], the medium noise cannot be improved (reduced). This is because if Ce₂Co₁₇ film thickness becomes too large, Ce₂Co₁₇ film orientation in the perpendicular direction to the film surface is deteriorated and the perpendicular magnetic anisotropic energy Ku becomes smaller. Thus, it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the perpendicular magnetization film.

As has been described above, the recording medium GG2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the GG2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region.

Moreover, when the Ce₂Co₁₇ film was provided under or both under and over the perpendicular magnetization film, similar results were obtained because of the aforementioned reasons.

Furthermore, in the experiment using the ID/MR composite head used in Example 11 instead of the mono-pole composite head, similar results were obtained because of the aforementioned reasons.

EXAMPLE 33

Media of Example 33 were prepared in the same way as Example 26, except for that the YCo₅ target for sputtering was replaced by a Sm₂Co₁₇ target.

The medium having the. Sm₂Co₁₇ of 50 [nm] will be referred to as HH2 of the present invention.

It should be noted we also prepared a medium having the Sm₂Co₁₇ film and the Co₇₈Cr₁₉Ta₃ (at %) film in the reversed order. That is, firstly, Sm₂Co₁₇ film was formed on the FeSiAl film, and then the Co₇₈Cr₁₉Ta₃ film was formed on the Sm₂Co₁₇ film.

As has been shown in Example 18, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ film is 9.0×10⁵ [erg/cc], whereas the perpendicular magnetic anisotropic energy of the Sm₂Co₁₇ film is 4.2×10⁷ [erg/cc], which is by far greater than the Ku of the Co₇₈Cr₁₉Ta₃ film. (See FIG. 90 and FIG. 7)

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium HH2 of the present invention and the conventional medium B1. The check conditions were the same as in Example 26.

FIG. 136 shows the medium noise dependency on the recording density for the HH2 of the present invention and the conventional medium B1. As is clear from FIG. 136, the conventional medium B1 shows a very high medium noise in the lower recording density, whereas in the medium HH2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium B1. This is because the medium HH2 of the present invention includes the film having much higher perpendicular magnetic anisotropy Ku than the Co₇₈Cr₁₉Ta₃ and the film is formed on the Co₇₈Cr₁₉Ta₃ film. Accordingly, in contrast to the conventional B1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 137. As is clear from FIG. 137, no output lowering can be seen up to 50 [nm] of the Ce₂Co₁₇ film. When the Ce₂Co₁₇ film thickness exceeds 50 [nm], the medium noise cannot be improved (reduced). This is because if Sm₂Co₁₇ film thickness becomes too large, Sm₂Co₁₇ film orientation in the perpendicular direction to the film surface is deteriorated and the perpendicular magnetic anisotropic energy Ku becomes smaller. Thus, it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the perpendicular magnetization film.

As has been described above, the recording medium HH2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the HH2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region.

Moreover, when the SM₂Co₁₇ film was provided under or both under and over the perpendicular magnetization film, similar results were obtained because of the aforementioned reasons.

Furthermore, in the experiment using the ID/MR composite head used in Example 11 instead of the mono-pole composite head, similar results were obtained because of the aforementioned reasons.

EXAMPLE 34

Media of Example 34 were prepared in the same way as Example 26, except for that the YCo₅ target for sputtering was replaced by a La₂Co₁₇ target.

The medium having the La₂Co₁₇ of 50 [nm] will be referred to as JJ2 of the present invention.

It should be noted we also prepared a medium having the La₂Co₁₇ film and the Co₇₈Cr₁₉Ta₃ (at %) film in the reversed order. That is, firstly, La₂Co₁₇ film was formed on the FeSiAl film, and then the Co₇₈Cr₁₉Ta₃ film was formed on the La₂Co₁₇ film.

As has been shown in Example 19, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ film is 9.0×10⁵ [erg/cc], whereas the perpendicular magnetic anisotropic energy of the La₂Co₁₇ film is 3.5×10⁷ [erg/cc], which is by far greater than the Ku of the Co₇₈Cr₁₉Ta₃ film. (See FIG. 90 and FIG. 7)

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium JJ2 of the present invention and the conventional medium B1. The check conditions were the same as in Example 26.

FIG. 138 shows the medium noise dependency on the recording density for the JJ2 of the present invention and the conventional medium B1. As is clear from FIG. 138, the conventional medium B1 shows a very high medium noise in the lower recording density, whereas in the medium JJ2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium B1. This is because the medium JJ2 of the present invention includes the film having much higher perpendicular magnetic anisotropy Ku than the Co₇₈Cr₁₉Ta₃ and the film is formed on the Co₇₈Cr₁₉Ta₃ film. Accordingly, in contrast to the conventional B1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 139. As is clear from FIG. 139, no output lowering can be seen up to 50 [nm] of the La₂Co₁₇ film. When the La₂Co₁₇ film thickness exceeds 50 [nm], the medium noise cannot be improved (reduced). This is because if La₂Co₁₇ film thickness becomes too large, La₂Co₁₇ film orientation in the perpendicular direction to the film surface is deteriorated and the perpendicular magnetic anisotropic energy Ku becomes smaller. Thus, it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the perpendicular magnetization film.

As has been described above, the recording medium JJ2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the JJ2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region.

Moreover, when the La₂Co₁₇ film was provided under or both under and over the perpendicular magnetization film, similar results were obtained because of the aforementioned reasons.

Furthermore, in the experiment using the ID/MR composite head used in Example 11 instead of the mono-pole composite head, similar results were obtained because of the aforementioned reasons.

EXAMPLE 35

Media of Example 35 were prepared in the same way as Example 26, except for that the YCo₅ target for sputtering was replaced by a Pr₂Co₁₇ target.

The medium having the Pr₂Co₁₇ of 50 [nm] will be referred to as KK2 of the present invention.

It should be noted we also prepared a medium having the Pr₂Co₁₇ film and the Co₇₈Cr₁₉Ta₃ (at %) film in the reversed order. That is, firstly, Pr₂Co₁₇ film was formed on the FeSiAl film, and then the Co₇₈Cr₁₉Ta₃ film was formed on the Pr₂Co₁₇ film.

As has been shown in Example 20, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ film is 9.0×10⁵ [erg/cc], whereas the perpendicular magnetic anisotropic energy of the La₂Co₁₇ film is 2.7×10⁷ [erg/cc], which is by far greater than the Ku of the Co₇₈Cr₁₉Ta₃ film. (See FIG. 90 and FIG. 7)

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium KK2 of the present invention and the conventional medium B1. The check conditions were the same as in Example 26.

FIG. 140 shows the medium noise dependency on the recording density for the KK2 of the present invention and the conventional medium B1. As is clear from FIG. 140, the conventional medium B1 shows a very high medium noise in the lower recording density, whereas in the medium KK2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium B1. This is because the medium KK2 of the present invention includes the film having much higher perpendicular magnetic anisotropy Ku than the Co₇₈Cr₁₉Ta₃ and the film is formed on the Co₇₈Cr₁₉Ta₃ film. Accordingly, in contrast to the conventional B1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 141. As is clear from FIG. 141, no output lowering can be seen up to 50 [nm] of the Pr₂Co₁₇ film. When the Pr₂Co₁₇ film thickness exceeds 50 [nm], the medium noise cannot be improved (reduced). This is because if Pr₂Co₁₇ film thickness becomes too large, Pr₂Co₁₇ film orientation in the perpendicular direction to the film surface is deteriorated and the perpendicular magnetic anisotropic energy Ku becomes smaller. Thus, it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the perpendicular magnetization film.

As has been described above, the recording medium KK2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the KK2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region.

Moreover, when the Pr₂Co₁₇ film was provided under or both under and over the perpendicular magnetization film, similar results were obtained because of the aforementioned reasons.

Furthermore, in the experiment using the ID/MR composite head used in Example 11 instead of the mono-pole composite head, similar results were obtained because of the aforementioned reasons.

EXAMPLE 36

Media of Example 36 were prepared in the same way as Example 26, except for that the YCo₅ target for sputtering was replaced by one of Ba ferrite materials, i.e., a BaFe₁₂O₁₉ target made from BaFe₁₂O₁₉.

The medium having the BaFe₁₂O₁₉ of 50 [nm] will be referred to as LL2 of the present invention.

It should be noted we also prepared a medium having the BaFe₁₂O₁₉ film and the Co₇₈Cr₁₉Ta₃ (at %) film in the reversed order. That is, firstly, BaFe₁₂O₁₉ film was formed on the FeSiAl film, and then the Co₇₈Cr₁₉Ta₃ film was formed on the BaFe₁₂O₁₉ film.

As has been shown in Example 21, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ film is 9.0×10⁵ [erg/cc], whereas the perpendicular magnetic anisotropic energy of the BaFe₁₂O₁₉ film is 3.3×10⁶ [erg/cc], which is by far greater than the Ku of the Co₇₈Cr₁₉Ta₃ film. (See FIG. 111 and FIG. 7)

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium LL2 of the present invention and the conventional medium B1. The check conditions were the same as in Example 26.

FIG. 142 shows the medium noise dependency on the recording density for the LL2 of the present-invention and the conventional medium B1. As is clear from FIG. 142, the conventional medium B1 shows a very high medium noise in the lower recording density, whereas in the medium LL2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium B1. This is because the medium LL2 of the present invention includes the film having much higher perpendicular magnetic anisotropy Ku than the Co₇₈Cr₁₉Ta₃ and the film is formed on the Co₇₈Cr₁₉Ta₃ film. Accordingly, in contrast to the conventional B1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 143. As is clear from FIG. 143, no output lowering can be seen up to 50 [nm] of the BaFe₁₂O₁₉ film. When the BaFe₁₂O₁₉ film thickness exceeds 50 [nm], the medium noise cannot be improved (reduced). This is because if the BaFe₁₂O₁₉ film thickness becomes too large, the BaFe₁₂O₁₉ film orientation in the perpendicular direction to the film surface is deteriorated and the perpendicular magnetic anisotropic energy Ku becomes smaller. Thus, it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the perpendicular magnetization film.

As has been described above, the recording medium LL2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the LL2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region.

Moreover, when the BaFe₁₂O₁₉ film was provided under or both under and over the perpendicular magnetization film, similar results were obtained because of the aforementioned reasons.

Furthermore, in the experiment using the ID/MR composite head used in Example 11 instead of the mono-pole composite head, similar results were obtained because of the aforementioned reasons.

EXAMPLE 37

Media of Example 37 were prepared in the same way as Example 26, except for that the YCo₅ target for sputtering was replaced by one of Ba ferrite materials, i.e., a BaFe₁₈O₂₇ target made from BaFe₁₈O₂₇.

The medium having the BaFe₁₈O₂₇ of 50 [nm] will be referred to as MM2 of the present invention.

It should be noted we also prepared a medium having the BaFe₁₈O₂₇ film and the Co₇₈Cr₁₉Ta₃ (at %) film in the reversed order. That is, firstly, BaFe₁₈O₂₇ film was formed on the FeSiAl film, and then the Co₇₈Cr₁₉Ta₃ film was formed on the BaFe₁₈O₂₇ film.

As has been shown in Example 22, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ film is 9.0×10⁵ [erg/cc], whereas the perpendicular magnetic anisotropic energy of the BaFe₁₈O₂₇ film is 3.0×10⁶ [erg/cc], which is by far greater than the Ku of the Co₇₈Cr₁₉Ta₃ film. (See FIG. 111 and FIG. 7)

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium MM2 of the present invention and the conventional medium B1. The check conditions were the same as in Example 26.

FIG. 144 shows the medium noise dependency on the recording density for the MM2 of the present invention and the conventional medium B1. As is clear from FIG. 144, the conventional medium B1 shows a very high medium noise in the lower recording density, whereas in the medium MM2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium B1. This is because the medium MM2 of the present invention includes the film having much higher perpendicular magnetic anisotropy Ku than the Co₇₈Cr₁₉Ta₃ and the film is formed on the Co₇₈Cr₁₉Ta₃ film. Accordingly, in contrast to the conventional B1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 145. As is clear from FIG. 145, no output lowering can be seen up to 50 [nm] of the BaFe₁₈O₂₇ film. When the BaFe₁₈O₂₇ film thickness exceeds 50 [nm], the medium noise cannot be improved (reduced). This is because if the BaFe₁₈O₂₇ film thickness becomes too large, the BaFe₁₈O₂₇ film orientation in the perpendicular direction to the film surface is deteriorated and the perpendicular magnetic anisotropic energy Ku becomes smaller. Thus, it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the perpendicular magnetization film.

As has been described above, the recording medium MM2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the MM2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region.

Moreover, when the BaFe₁₈O₂₇ film was provided under or both under and over the perpendicular magnetization film, similar results were obtained because of the aforementioned reasons.

Furthermore, in the experiment using the ID/MR composite head used in Example 11 instead of the mono-pole composite head, similar results were obtained because of the aforementioned reasons.

EXAMPLE 38

Media of Example 38 were prepared in the same way as Example 26, except for that the YCo₅ target for sputtering was replaced by one of Sr ferrite materials, i.e., a SrFe₁₂O₁₉ target made from SrFe₁₂O₁₉.

The medium having the SrFe₁₂O₁₉ of 50 [nm] will be referred to as NN2 of the present invention.

It should be noted we also prepared a medium having the SrFe₁₂O₁₉ film and the Co₇₈Cr₁₉Ta₃ (at %) film in the reversed order. That is, firstly, the SrFe₁₂O₁₉ film was formed on the FeSiAl film, and then the Co₇₈Cr₁₉Ta₃ film was formed on the SrFe₁₂O₁₉ film.

As has been shown in Example 23, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ film is 7.0×10⁵ [erg/cc], whereas the perpendicular magnetic anisotropic energy of the SrFe₁₂O₁₉ film is 3.4×10⁶ [erg/cc], which is by far greater than the Ku of the Co₇₈Cr₁₉Ta₃ film. (See FIG. 111 and FIG. 7)

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium NN2 of the present invention and the conventional medium B1. The check conditions were the same as in Example 26.

FIG. 146 shows the medium noise dependency on the recording density for the NN2 of the present invention and the conventional medium B1. As is clear from FIG. 146, the conventional medium B1 shows a very high medium noise in the lower recording density, whereas in the medium NN2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium B1. This is because the medium NN2 of the present invention includes the film having much higher perpendicular magnetic anisotropy Ku than the Co₇₈Cr₁₉Ta₃ and the film is formed on the Co₇₈Cr₁₉Ta₃ film. Accordingly, in contrast to the conventional B1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 147. As is clear from FIG. 147, no output lowering can be seen up to 50 [nm] of the SrFe₁₂O₁₉ film. When the SrFe₁₂O₁₉ film thickness exceeds 50 [nm], the medium noise cannot be improved (reduced). This is because if the SrFe₁₂O₁₉ film thickness becomes too large, the SrFe₁₂O₁₉ film orientation in the perpendicular direction to the film surface is deteriorated and the perpendicular magnetic anisotropic energy Ku becomes smaller. Thus, it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the perpendicular magnetization film.

As has been described above, the recording medium NN2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the NN2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region.

Moreover, when the SrFe₁₂O₁₉ film was provided under or both under and over the perpendicular magnetization film, similar results were obtained because of the aforementioned reasons.

Furthermore, in the experiment using the ID/MR composite head used in Example 11 instead of the mono-pole composite head, similar results were obtained because of the aforementioned reasons.

EXAMPLE 39

Media of Example 39 were prepared in the same way as. Example 26, except for that the YCo₅ target for sputtering was replaced by one of Sr ferrite materials, i.e., a SrFe₁₈O₂₇ target made from SrFe₁₈O₂₇.

The medium having the SrFe₁₈O₂₇ of 50 [nm] will be referred to as PP2 of the present invention.

It should be noted we also prepared a medium having the SrFe₁₈O₂₇ film and the Co₇₈Cr₁₉Ta₃ (at %) film in the reversed order. That is, firstly, the SrFe₁₈O₂₇ film was formed on the FeSiAl film, and then the Co₇₈Cr₁₉Ta₃ film was formed on the SrFe₁₈O₂₇ film.

As has been shown in Example 24, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ film is 9.0×10⁵ [erg/cc], whereas the perpendicular magnetic anisotropic energy of the SrFe₁₈O₂₇ film is 3.1×10⁶ [erg/cc], which is by far greater than the Ku of the Co₇₈Cr₁₉Ta₃ film. (See FIG. 111 and FIG. 7)

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium PP2 of the present invention and the conventional medium B1. The check conditions were the same as in Example 26.

FIG. 148 shows the medium noise dependency on the recording density for the PP2 of the present invention and the conventional medium B1. As is clear from FIG. 148, the conventional medium B1 shows a very high medium noise in the lower recording density, whereas in the medium PP2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium B1. This is because the medium PP2 of the present invention includes the film having much higher perpendicular magnetic anisotropy Ku than the Co₇₈Cr₁₉Ta₃ and the film is formed on the Co₇₈Cr₁₉Ta₃ film. Accordingly, in contrast to the conventional B1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 149. As is clear from FIG. 149, no output lowering can be seen up to 50 [nm] of the SrFe₁₈O₂₇ film. When the SrFe₁₈O₂₇ film thickness exceeds 50 [nm], the medium noise cannot be improved (reduced). This is because if the SrFe₁₈O₂₇ film thickness becomes too large, the SrFe₁₈O₂₇ film orientation in the perpendicular direction to the film surface is deteriorated and the perpendicular magnetic anisotropic energy Ku becomes smaller. Thus, it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the perpendicular magnetization film.

As has been described above, the recording medium PP2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the PP2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region.

Moreover, when the SrFe₁₈O₂₇ film was provided under or both under and over the perpendicular magnetization film, similar results were obtained because of the aforementioned reasons.

Furthermore, in the experiment using the ID/MR composite head used in Example 11 instead of the mono-pole composite head, similar results were obtained because of the aforementioned reasons.

EXAMPLE 40

Media of Example 40 were prepared in the same way as Example 26, except for that the YCo₅ target for sputtering was replaced by Pt₅₀Co₅₀ (at %) target The medium having the Pt₅₀Co₅ of 50 [nm] will be referred to as QQ2 of the present invention.

It should be noted we also prepared a medium having the Pt₅₀Co₅₀ film and the Co₇₈Cr₁₉Ta₃ (at %) film in the reversed order. That is, firstly, the Pt₅₀Co₅₀ film was formed on the FeSiAl film, and then the Co₇₈Cr₁₉Ta₃ film was formed on the Pt₅₀Co₅₀ film.

As has been shown in Example 25, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ film is 9.0×10⁵ [erg/cc], whereas the perpendicular magnetic anisotropic energy of the Pt₅₀Co₅₀ film is 1.0×10⁷ [erg/cc], which is by far greater than the Ku of the Co₇₈Cr₁₉Ta₃ film. (See FIG. 111 and FIG. 7)

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium QQ2 of the present invention and the conventional medium B1. The check conditions were the same as in Example 26.

FIG. 150 shows the medium noise dependency on the recording density for the QQ2 of the present invention and the conventional medium B1. As is clear from FIG. 150, the conventional medium B1 shows a very high medium noise in the lower recording density, whereas in the medium QQ2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium B1. This is because the medium QQ2 of the present invention includes the film having much higher perpendicular magnetic anisotropy Ku than the Co₇₈Cr₁₉Ta₃ and the film is formed on the Co₇₈Cr₁₉Ta₃ film. Accordingly, in contrast to the conventional B1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 151. As is clear from FIG. 151, no output lowering can be seen up to 50 [nm] of the Pt₅₀Co₅₀ (at %) film. When the Pt₅₀Co₅₀ film thickness exceeds 50 [nm], the medium noise cannot be improved (reduced). This is because if the Pt₅₀Co₅₀ film thickness becomes too large, the Pt₅₀Co₅₀ film orientation in the perpendicular direction to the film surface is deteriorated and the perpendicular magnetic anisotropic energy Ku becomes smaller. Thus, it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the perpendicular magnetization film.

As has been described above, the recording medium QQ2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the QQ2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region.

Moreover, when the Pt₅₀Co₅₀ (at %) film was provided under or both under and over the perpendicular magnetization film, similar results were obtained because of the aforementioned reasons.

Furthermore, in the experiment using the ID/MR composite head used in Example 1 instead of the mono-pole composite head, similar results were obtained because of the aforementioned reasons.

EXAMPLE 41

Media of Example 41 were prepared in the same way as Example 26, except for that for sputtering, the YCo₅ target was replaced by SmCo₅ target, and the FeSiAl target was replaced by a FeTaN target.

The medium having the SmCo₅ of 50 [nm] will be referred to as RR2 of the present invention.

Note that we also prepared a medium having no SmCo₅ film. This medium will be referred to as C1.

We also prepared a medium having the SmCo₅ film and the Co₇₈Cr₁₉Ta3 (at %) film in the reversed order. That is, firstly, the SmCo₅ film was formed on the FeTaN film, and then the Co₇₈Cr₁₉Ta₃ film was formed on the SmCo₅ film.

As has been shown in Example 13, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ film is 9.0×10⁵ [erg/cc], whereas the perpendicular magnetic anisotropic energy of the SmCo₅ film is 1.0×10⁸ [erg/cc], which is by far greater than the Ku of the Co₇₈Cr₁₉Ta₃ film. (See FIG. 90 and FIG. 7)

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium RR2 of the present invention and the conventional medium C1. The check conditions were the same as in Example 26.

FIG. 152 shows the medium noise dependency on the recording density for the RR2 of the present invention and the conventional medium C1. As is clear from FIG. 152, the conventional medium C1 shows a very high medium noise in the lower recording density, whereas in the medium RR2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium C1. This is because the medium RR2 of the present invention includes the film having much higher perpendicular magnetic anisotropy Ku than the Co₇₈Cr₁₉Ta₃ and the film is formed on the Co₇₈Cr₁₉Ta₃ film. Accordingly, in contrast to the conventional C1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 153. As is clear from FIG. 153, no output lowering can be seen up to 50 [nm] of the SmCo₅ (at %) film. When the SmCo₅ film thickness exceeds 50 [nm], the medium noise cannot be improved (reduced). This is because if the SmCo₅ film thickness becomes too large, the SmCo₅ film orientation in the perpendicular direction to the film surface is deteriorated and the perpendicular magnetic anisotropic energy Ku becomes smaller. Thus, it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the perpendicular magnetization film.

As has been described above, the recording medium RR2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the RR2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region.

Moreover, when the SmCo₅ film was provided under or both under and over the perpendicular magnetization film, similar results were obtained because of the aforementioned reasons.

Furthermore, in the experiment using the ID/MR composite head used in Example 11 instead of the mono-pole composite head, similar results were obtained because of the aforementioned reasons.

EXAMPLE 42

Media of Example 42 were prepared in the same way as Example 41, except for that for sputtering, the SmCo₅ target was replaced by Sm₂Co₁₇ target.

The medium having the Sm₂Co₁₇ of 50 [nm] will be referred to as SS2 of the present invention.

Note that we also prepared a medium having the Sm₂Co₁₇ film and the Co₇₈Cr₁₉Ta₃ (at %) film in the reversed order. That is, firstly, the Sm₂Co₁₇ film was formed on the FeTaN film, and then the Co₇₈Cr₁₉Ta₃ film was formed on the Sm₂Co₁₇ film.

As has been shown in Example 18, the perpendicular magnetic anisotropic energy Ku of the Co₇₈Cr₁₉Ta₃ film is 9.0×10⁵ [erg/cc], whereas the perpendicular magnetic anisotropic energy of the Sm₂Co₁₇ film is 4.2×10⁷ [erg/cc], which is by far greater than the Ku of the Co₇₈Cr₁₉Ta₃ film. (See FIG. 90 and FIG. 7)

By using a mono-pole/MR (magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium SS2 of the present invention and the conventional medium C1. The check conditions were the same as in Example 26.

FIG. 154 shows the medium noise dependency on the recording density for the SS2 of the present invention and the conventional medium C1. As is clear from FIG. 154, the conventional medium C1 shows a very high medium noise in the lower recording density, whereas in the medium SS2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium C1. This is because the medium SS2 of the present invention includes the film having much higher perpendicular magnetic anisotropy Ku than the Co₇₈Cr₁₉Ta₃ and the film is formed on the Co₇₈Cr₁₉Ta₃ film. Accordingly, in contrast to the conventional C1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.

Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in FIG. 155. As is clear from FIG. 155, no output lowering can be seen up to 50 [nm] of the Sm₂Co₁₇ (at %) film. When the Sm₂Co₁₇ film thickness exceeds 50 [nm], the medium noise cannot be improved (reduced). This is because if the Sm₂Co₁₇ film thickness becomes too large, the Sm₂Co₁₇ film orientation in the perpendicular direction to the film surface is deteriorated and the perpendicular magnetic anisotropic energy Ku becomes smaller. Thus, it becomes impossible to suppress generation of a reversed magnetic domain in the vicinity of the perpendicular magnetization film.

As has been described above, the recording medium SS2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the SS2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region.

Moreover, when the Sm₂Co₁₇ film was provided under or both under and over the perpendicular magnetization film, similar results were obtained because of the aforementioned reasons.

Furthermore, in the experiment using the ID/MR composite head used in Example 11 instead of the mono-pole composite head, similar results were obtained because of the aforementioned reasons.

In the perpendicular magnetic recording media according to the present invention, a perpendicular magnetic film is provided with a high perpendicular orientation film which has a higher perpendicular orientation than that perpendicular magnetic film and formed over or under the perpendicular magnetic film. This significantly suppress medium noise, i.e., generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetic film. This enables to obtain a perpendicular magnetic recording medium having a preferable medium noise characteristic.

This medium noise characteristic is further improved if the following condition is satisfied when the high perpendicular orientation film is formed using a CoCr alloy.

That is, the perpendicular magnetic anisotropic energy Ku [erg/cc] an the saturation magnetization Ms [emu/cc] is in the relationship: R=2Ku/4^(π)Ms². If the CoCr alloy satisfies R≧1.4, an excellent effect can be obtained.

When the high perpendicular orientation film is made from RCo5 (R=Y, Ce, Sm, La, Pr) film, Ba ferrite film, Sr ferrite, and PtCo, it is possible an excellent effect if these films has a perpendicular magnetic anisotropic energy Ku greater than the perpendicular magnetic anisotropic energy of the perpendicular magnetization film.

The invention may be embodied in other specific forms without departing from the spirit or essential characteristic thereof. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein.

The entire disclosure of Japanese Patent Application No. 10-244060 (filed on Aug. 28^(th), 1998) including specification, claims, drawings and summary are incorporated herein by reference in its entirety. 

What is claimed is:
 1. A perpendicular magnetic recording medium having a perpendicular magnetization film formed on a substrate, wherein a high perpendicular orientation film having higher perpendicular magnetic anisotropic energy than the perpendicular magnetization film is formed over or/and under the perpendicular magnetization film; wherein the high perpendicular orientation film is made from a Ba ferrite having a film thickness less than 50 nm.
 2. A perpendicular magnetic recording medium as claimed in claim 1, wherein the Ba ferrite comprises BaFe₁₂O₁₉.
 3. A perpendicular magnetic recording medium as claimed in claim 1, wherein the Ba ferrite comprises BaFe₁₈O₂₇.
 4. A perpendicular magnetic recording medium having a perpendicular magnetization film formed on a substrate, wherein a high perpendicular orientation film having higher perpendicular magnetic anisotropic energy than the perpendicular magnetization film is formed over or/and under the perpendicular magnetization film; wherein the high perpendicular orientation film is made from a Sr ferrite having a film thickness less than 50 nm.
 5. A perpendicular magnetic recording medium as claimed in claim 4, wherein the Sr ferrite comprises SrFe₁₂O₁₉.
 6. A perpendicular magnetic recording medium as claimed in claim 4, wherein the Sr ferrite comprises SrFe₁₈O₂₇. 